Y. Joly, L. Lopez, J. Portal, H. Aziza, P. Masson, J. Ogier, Y. Bert, F. Julien, P. Fornara
{"title":"Octagonal MOSFET: Reliable device for low power analog applications","authors":"Y. Joly, L. Lopez, J. Portal, H. Aziza, P. Masson, J. Ogier, Y. Bert, F. Julien, P. Fornara","doi":"10.1109/ESSDERC.2011.6044176","DOIUrl":null,"url":null,"abstract":"Low power analog circuits needs large and short MOSFETs biased in the sub-threshold area with good performances in terms of matching. In order to reach these specifications, octagonal transistors are proposed. Due to their design, these transistors avoid hump effect. As a consequence, gate-source voltage matching under-threshold is always at its best level. Moreover, the paper shows the device robustness to hot carrier stress is improved on octagonal NMOS; VT matching degradation due to hot carrier stress is also improved with an octagonal design.","PeriodicalId":161896,"journal":{"name":"2011 Proceedings of the European Solid-State Device Research Conference (ESSDERC)","volume":"31 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-10-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 Proceedings of the European Solid-State Device Research Conference (ESSDERC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESSDERC.2011.6044176","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
Low power analog circuits needs large and short MOSFETs biased in the sub-threshold area with good performances in terms of matching. In order to reach these specifications, octagonal transistors are proposed. Due to their design, these transistors avoid hump effect. As a consequence, gate-source voltage matching under-threshold is always at its best level. Moreover, the paper shows the device robustness to hot carrier stress is improved on octagonal NMOS; VT matching degradation due to hot carrier stress is also improved with an octagonal design.