Study of the GaN based LEDs grown with highest throughput MOCVD platform — AMEC Prismo A7TM

Jason Hoo, Yao Chen, Hongwei Li, Lion Wang, Yingbin Liu, Vincent Wang, Shiping Guo, Zhiyou Du
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Abstract

There has been continuous effort to reduce the cost of III-nitride devices for market penetration of solid state lighting as well as the next generation of power device applications. Using high throughput MOCVD platform is one of the critical drivers to reduce the cost of ownership (CoO) of various light emitting diodes (LED) products. GaN based LEDs grown on 4” patterned sapphire substrates (PSSs) is the primary method for LED manufacturers to further lower CoO. Here we report LED growth on 4” PSSs with the highest throughput MOCVD platform, AMEC Prismo A7TM High quality GaN based single layer materials and LEDs have been grown on both normal 4” PSSs and PSSs with AlN buffer prepared by physical vapor deposition (PVD). Excellent thickness uniformity of less than 1.5% and wavelength uniformity of less than 1.5 nm (1σ with 2 mm edge exclusion) have been achieved for green and blue LEDs on 4” PSSs and PSSs with PVD AlN. In addition, initial results for LEDs growth on 6” PSSs are also reported in this paper.
在最高通量MOCVD平台上生长GaN基led的研究- AMEC Prismo A7TM
为了使iii -氮化物器件在固态照明市场的渗透以及下一代功率器件的应用,人们一直在不断努力降低iii -氮化物器件的成本。采用高通量MOCVD平台是降低各种发光二极管产品拥有成本的关键驱动因素之一。在4英寸蓝宝石衬底(pss)上生长GaN基LED是LED制造商进一步降低CoO的主要方法。在这里,我们报告了使用最高吞吐量MOCVD平台(AMEC Prismo A7TM)在4英寸pss上生长LED的高质量GaN基单层材料和LED已经在正常的4英寸pss和通过物理气相沉积(PVD)制备的AlN缓冲层pss上生长。在4 " pss和PVD AlN的pss上,绿色和蓝色led的厚度均匀性小于1.5%,波长均匀性小于1.5 nm (1σ, 2 mm边缘排除)。此外,本文还报道了在6 " pss上生长led的初步结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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