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Junction leakage in advanced CMOS technologies

31st European Solid-State Device Research Conference Pub Date : 2001-09-11 DOI:10.1109/ESSDERC.2001.195229
C. Dachs, R. Surdeanu, D. Guyot, A. Parlangeli, Y. Ponomarev, P. Stolk
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先进CMOS技术中的结漏
本文章由计算机程序翻译，如有差异，请以英文原文为准。
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31st European Solid-State Device Research Conference
31st European Solid-State Device Research Conference
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