Damageless and conformai doping for FinFETs by spin-coated phosphorus doped silica

T. Matsukawa, T. Mori, Y. Sawada, Y. Kinoshita, Yongxun Liu, M. Masahara
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Abstract

Damageless and conformal doping process for FinFETs is demonstrated by solid diffusion utilizing cost-effective spin-coated phosphorus dopes silica (PDS). Damageless nature of the PDS diffusion doping is confirmed by TEM characterization of the doped fin. The PDS diffusion is successfully implemented in the extension doping of the FinFETs. The fabricated FinFETs with the PDS diffusion doping exhibit suppression of the series resistance and its fluctuation in comparison with the phosphorus I/I reference, showing effectiveness of the PDS diffusion as the damageless and conformal doping solution required for the further-scaled FinFETs in future.
自旋包覆磷掺杂二氧化硅的finfet无损共形掺杂
利用具有成本效益的自旋包覆磷掺杂二氧化硅(PDS)进行固体扩散,证明了finfet的无损伤和适形掺杂工艺。通过对掺杂晶片的TEM表征,证实了PDS扩散掺杂的无损伤性,成功地实现了PDS扩散在finfet扩展掺杂中的应用。与磷I/I对照相比,PDS扩散掺杂制备的finfet表现出串联电阻及其波动的抑制作用,表明PDS扩散掺杂是未来进一步规模化finfet所需的无损伤和适形掺杂溶液的有效性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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