M. Collonge, M. Vinet, M. Ribeiro, J. Pedini, B. Previtali, T. Ernst, S. Bécu, G. Ghibaudo
{"title":"Analytical modeling of Accumulation-Mode Suspended-Gate MOSFET and process challenges for very low operating power devices","authors":"M. Collonge, M. Vinet, M. Ribeiro, J. Pedini, B. Previtali, T. Ernst, S. Bécu, G. Ghibaudo","doi":"10.1109/VTSA.2009.5159315","DOIUrl":null,"url":null,"abstract":"For the first time, an analytical model of an Accumulation-Mode Suspended-Gate MOSFET is proposed. For very low power operation, adhesion energies of gate and gate oxide as low as 130µJ/m2 are required as well as sub-2.3N/m doubly clamped gate. Experimentally a 0.2N/m suspended silicon nanowire was processed, opening perspectives for device downscaling.","PeriodicalId":309622,"journal":{"name":"2009 International Symposium on VLSI Technology, Systems, and Applications","volume":"191 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 International Symposium on VLSI Technology, Systems, and Applications","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTSA.2009.5159315","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
For the first time, an analytical model of an Accumulation-Mode Suspended-Gate MOSFET is proposed. For very low power operation, adhesion energies of gate and gate oxide as low as 130µJ/m2 are required as well as sub-2.3N/m doubly clamped gate. Experimentally a 0.2N/m suspended silicon nanowire was processed, opening perspectives for device downscaling.