Novel copper surface preparation processes for copper alloy lead frame lamination pretreatment in embedded packaging device

Wei-chung Chen, C. Lee, Lu-Fu Lin, Yen-Fu Liu, H. Cheng, T.-J Hsu, Kun-Ting Tsai, Ming-Hung Chen, Tang-Yuan Chen, P. Yang, S. Uegaki, C. Hung
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Abstract

In this paper, the interface adhesion and reliability between copper lead frame(C-19210) and resin prepreg material of different copper lead frame lamination pretreatment processes (CZ and brown oxide) was studied. Surface morphology, roughness, peel strength and moisture sensitivity level, MSL3, reliability tests were performed in order to investigate the performance between these pretreatment procedures. CZ (HCl/formic acid system) process for copper etching is commonly used for lamination pretreatment, but it is not suitable to create uniformity coarse surface on copper alloy material. Compare to CZ, brown oxide gives better uniformity morphology, higher Ra/s-ratio and stronger peel strength. Reliability test including precondition + MSL3 (failure rate: BO CZ=14:100) and solder dipping (260, 270, 288 °C × 10 times) were performed to evaluate the bond strength.
嵌入式封装装置中铜合金引线框架层压预处理的新型铜表面制备工艺
本文研究了不同铜引线框架层压预处理工艺(CZ和棕氧化物)的树脂预浸料(C-19210)与铜引线框架的界面附着力和可靠性。进行了表面形貌、粗糙度、剥离强度和水分敏感性水平、MSL3、可靠性测试,以研究这些预处理程序之间的性能。铜蚀刻CZ (HCl/甲酸体系)工艺是常用的层压预处理工艺,但不适合在铜合金材料上形成均匀的粗糙表面。与CZ相比,棕色氧化物具有更好的形貌均匀性,更高的Ra/s比和更强的剥离强度。通过预置+ MSL3(故障率:BO CZ=14:100)和浸焊(260、270、288℃× 10次)进行可靠性试验,评估结合强度。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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