Comprehensive physical and chemical characterization of the galvanic corrosion induced failures

2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Pub Date : 2016-07-18 DOI:10.1109/IPFA.2016.7564312

Yixin Chen, Younan Hua, B. S. Khoo, Henry Leong, Vanie Bagulbagul, Yansong Wang, Yanlin Pan, E. Chan, Maohua Chen, Jing Yuan Wang, Yue Shen, Zilu Niu, J. Goh, E. Abella, Xiaomin Li

引用次数: 0

Abstract

The galvanic corrosion induced failures have been investigated for three cases in PCB, TFT touch screen and wire bonding industries using comprehensive physical and chemical characterization methods. Obvious evidences of anode oxidation and corrosive ions were found for all three cases. Characterization methodology should be tailored based on different situations.

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电偶腐蚀失效的综合物理化学表征

采用综合的物理化学表征方法，对PCB、TFT触摸屏和焊线行业的三种电偶腐蚀失效进行了研究。在这三种情况下都发现了明显的阳极氧化和腐蚀离子。表征方法应根据不同的情况进行调整。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

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