Low cost flip chip bumping

T. Oppert, T. Teutsch, E. Zakel
{"title":"Low cost flip chip bumping","authors":"T. Oppert, T. Teutsch, E. Zakel","doi":"10.1109/EMAP.2000.904135","DOIUrl":null,"url":null,"abstract":"Flip chip (FC) technology is a driving force for increased speed and performance along with higher I/O count, and has therefore a high level of importance for a variety of applications. A breakthrough, however, will be the use of flip chip due to cost reduction. To achieve this aim, it is essential to use low cost bumping techniques. However, to provide FC technologies for devices with high I/O count and high pin density applications like microcontrollers, RAMBUS devices, etc., it is necessary to redistribute the historically peripheral bond pads with ultra fine pad pitch into a wafer level CSP. This paper describes a low cost electroless Ni/Au under bump metallization (UBM), a wafer level redistribution process based on electroless copper circuitization and different methods of single and multiple solder ball placement.","PeriodicalId":201234,"journal":{"name":"International Symposium on Electronic Materials and Packaging (EMAP2000) (Cat. No.00EX458)","volume":"275 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-11-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Symposium on Electronic Materials and Packaging (EMAP2000) (Cat. No.00EX458)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMAP.2000.904135","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 11

Abstract

Flip chip (FC) technology is a driving force for increased speed and performance along with higher I/O count, and has therefore a high level of importance for a variety of applications. A breakthrough, however, will be the use of flip chip due to cost reduction. To achieve this aim, it is essential to use low cost bumping techniques. However, to provide FC technologies for devices with high I/O count and high pin density applications like microcontrollers, RAMBUS devices, etc., it is necessary to redistribute the historically peripheral bond pads with ultra fine pad pitch into a wafer level CSP. This paper describes a low cost electroless Ni/Au under bump metallization (UBM), a wafer level redistribution process based on electroless copper circuitization and different methods of single and multiple solder ball placement.
低成本倒装芯片碰撞
倒装芯片(FC)技术是提高速度和性能以及更高I/O计数的驱动力,因此对各种应用具有很高的重要性。然而,由于成本降低,倒装芯片的使用将是一个突破。为了实现这一目标,必须使用低成本的碰撞技术。然而,为了为具有高I/O数和高引脚密度应用的设备(如微控制器、RAMBUS设备等)提供FC技术,有必要将历史上具有超细焊距的外围键合焊盘重新分配到晶圆级CSP中。本文介绍了一种低成本的凹凸金属化化学镀镍/金工艺,一种基于化学镀铜电路化的晶圆级重分布工艺,以及不同的单、多焊点放置方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信