Radiation Hardness of the CLARO8 ASIC: A Fast Single-Photon Counting Chip for the LHCb Experiment at CERN

M. Andreotti, Wander Baldini, M. Baszczyk, R. Calabrese, A. Candelori, P. Carniti, L. Cassina, A. Cotta Ramusino, P. Dorosz, M. Fiorini, Andrea Giachero, C. Gotti, W. Kucewicz, E. Luppi, M. Maino, R. Malaguti, S. Mattiazzo, L. Minzoni, L. Pappalardo, G. Pessina, L. Silvestrin, L. Tomassetti
{"title":"Radiation Hardness of the CLARO8 ASIC: A Fast Single-Photon Counting Chip for the LHCb Experiment at CERN","authors":"M. Andreotti, Wander Baldini, M. Baszczyk, R. Calabrese, A. Candelori, P. Carniti, L. Cassina, A. Cotta Ramusino, P. Dorosz, M. Fiorini, Andrea Giachero, C. Gotti, W. Kucewicz, E. Luppi, M. Maino, R. Malaguti, S. Mattiazzo, L. Minzoni, L. Pappalardo, G. Pessina, L. Silvestrin, L. Tomassetti","doi":"10.1109/NSREC.2016.7891728","DOIUrl":null,"url":null,"abstract":"Radiation hardness tests of the CLARO8 ASIC, designed in AMS 0.35micron CMOS technology for the upgrade of the CERN LHCb RICH detectors, are presented, including measurements of total- ionizing dose and single event effects.","PeriodicalId":135325,"journal":{"name":"2016 IEEE Radiation Effects Data Workshop (REDW)","volume":"411 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE Radiation Effects Data Workshop (REDW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NSREC.2016.7891728","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

Abstract

Radiation hardness tests of the CLARO8 ASIC, designed in AMS 0.35micron CMOS technology for the upgrade of the CERN LHCb RICH detectors, are presented, including measurements of total- ionizing dose and single event effects.
欧洲核子研究中心LHCb实验用快速单光子计数芯片CLARO8 ASIC的辐射硬度
介绍了为升级CERN LHCb RICH探测器而采用AMS 0.35微米CMOS技术设计的CLARO8专用集成电路的辐射硬度测试,包括总电离剂量和单事件效应的测量。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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