At-Product-Test Dedicated Adaptive supply-resonance suppression

Abstract

This paper presents an adaptive supply-resonance (SR) suppression scheme at a product testing stage. Dedicated to each product in different assembly forms, an on-chip power-delivery-network analyzer identifies SR frequency and autotunes notch filter for SR noise suppression. The feasibility has been silicon-proven by a prototype demonstration in 0.18μm CMOS successfully.