QFN challenges: Second bond improvement to eliminate the weak stitch (fish tail) failure mechanism on pre plated lead frame

Jacky Lee Sinn Fah, S. Sekaran, Rameish Rao Subarmaniyan, Camella Chee Guey Yong
{"title":"QFN challenges: Second bond improvement to eliminate the weak stitch (fish tail) failure mechanism on pre plated lead frame","authors":"Jacky Lee Sinn Fah, S. Sekaran, Rameish Rao Subarmaniyan, Camella Chee Guey Yong","doi":"10.1109/IEMT.2016.7761936","DOIUrl":null,"url":null,"abstract":"Most of the device's technology has been moving towards the complex and produce of Nano-IC with demands for cheaper cost, smaller size and better thermal and electrical performance. One of the marketable packages is Quad Flat No-Lead (QFN) package. Due to the high demand of miniaturization of electronic products, QFN development becomes more promising, such as the lead frame design with half edge, cheaper tape, shrinkage of package size as to achieve more units per lead frame (cost saving) and etc [1]. The improvement methods in the lead frame design, such as lead frame metal tie bar and half edge features are always the main challenges for QFN package. With reduced the size of metal tie bar, it will fasten the package singulation process, whereas the half edge is designed for the mold compound locking for delamination reduction purpose. This paper specifically will discuss how the critical wire bonding parameters, capillary design and environmental conditions interact each other result to the unstable leads (second bond failures). During the initial evaluation of new package SOT1261 with rough PPF lead frame, several short tails and fish tails observed on wedge bond when applied with the current parameter setting which have been qualified in other packages with same wire size (18um Au wire). These problems did not surface out in earlier qualified devices mainly due to the second bond parameter robustness, capillary designs, lead frame design changes, different die packages, lead frame batches and contamination levels. One of the main root cause been studied is the second bond parameter setting which is not robust enough for the flimsy lead frame. The new bonding methodology, with the concept of low base ultrasonic and high force setting applied together with scrubbing mechanism to eliminate the fish tail bond and also reduce short tail occurrence on wedge. Wire bond parameters optimized to achieve zero fish tail, and wedge pull reading with >4.0gf. Destructive test such as wedge pull test used to test the bonding quality. Failure modes are analyzed using high power optical scope microscope and Scanning Electronic Microscope (SEM). By looking through into all possible root causes, and identifying how the factors are interacting, some efforts on the Design of Experiments (DOE) are carried out and good solutions were implemented.","PeriodicalId":237235,"journal":{"name":"2016 IEEE 37th International Electronics Manufacturing Technology (IEMT) & 18th Electronics Materials and Packaging (EMAP) Conference","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE 37th International Electronics Manufacturing Technology (IEMT) & 18th Electronics Materials and Packaging (EMAP) Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMT.2016.7761936","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

Most of the device's technology has been moving towards the complex and produce of Nano-IC with demands for cheaper cost, smaller size and better thermal and electrical performance. One of the marketable packages is Quad Flat No-Lead (QFN) package. Due to the high demand of miniaturization of electronic products, QFN development becomes more promising, such as the lead frame design with half edge, cheaper tape, shrinkage of package size as to achieve more units per lead frame (cost saving) and etc [1]. The improvement methods in the lead frame design, such as lead frame metal tie bar and half edge features are always the main challenges for QFN package. With reduced the size of metal tie bar, it will fasten the package singulation process, whereas the half edge is designed for the mold compound locking for delamination reduction purpose. This paper specifically will discuss how the critical wire bonding parameters, capillary design and environmental conditions interact each other result to the unstable leads (second bond failures). During the initial evaluation of new package SOT1261 with rough PPF lead frame, several short tails and fish tails observed on wedge bond when applied with the current parameter setting which have been qualified in other packages with same wire size (18um Au wire). These problems did not surface out in earlier qualified devices mainly due to the second bond parameter robustness, capillary designs, lead frame design changes, different die packages, lead frame batches and contamination levels. One of the main root cause been studied is the second bond parameter setting which is not robust enough for the flimsy lead frame. The new bonding methodology, with the concept of low base ultrasonic and high force setting applied together with scrubbing mechanism to eliminate the fish tail bond and also reduce short tail occurrence on wedge. Wire bond parameters optimized to achieve zero fish tail, and wedge pull reading with >4.0gf. Destructive test such as wedge pull test used to test the bonding quality. Failure modes are analyzed using high power optical scope microscope and Scanning Electronic Microscope (SEM). By looking through into all possible root causes, and identifying how the factors are interacting, some efforts on the Design of Experiments (DOE) are carried out and good solutions were implemented.
QFN挑战:第二次键合改进,以消除预镀引线框架上的弱缝线(鱼尾)失效机制
随着对成本更低、尺寸更小、热电性能更好的要求,大多数器件技术正朝着纳米集成电路的复杂和生产方向发展。其中一个有市场的封装是四平无铅(QFN)封装。由于电子产品小型化的高要求,QFN的发展变得更加有前景,例如采用半边沿的引线框架设计,更便宜的胶带,缩小封装尺寸以实现每个引线框架更多的单元(节省成本)等[1]。引线框架设计中的改进方法,如引线框架金属拉杆和半边特征一直是QFN封装面临的主要挑战。减小金属拉杆的尺寸,紧固封装成型过程,而半边设计用于模具复合锁紧,减少分层。本文将具体讨论关键导线键合参数、毛细管设计和环境条件如何相互作用导致引线不稳定(二次键合失效)。在对带有粗糙PPF引线框架的新封装SOT1261进行初步评估时,当使用当前参数设置时,在楔形键合上观察到几个短尾和鱼尾,这些尾和鱼尾在具有相同线尺寸(18um Au线)的其他封装中已经合格。这些问题在早期的合格器件中没有出现,主要是由于第二键参数的稳健性、毛细管设计、引线框架设计的变化、不同的模具封装、引线框架批次和污染水平。研究的主要根本原因之一是对脆弱的引线框架的二次键参数设置不够鲁棒。采用低基超声和高力设置的新粘接方法,结合洗涤机构,消除了鱼尾粘接,减少了楔板短尾的发生。优化钢丝键合参数,实现零鱼尾,楔形拉力读数>4.0gf。破坏性试验,如楔拉试验,用于检验粘接质量。采用高倍光学显微镜和扫描电子显微镜对其失效模式进行了分析。通过调查所有可能的根本原因,并确定因素如何相互作用,在实验设计(DOE)上进行了一些努力,并实施了良好的解决方案。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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