A MEMS-based compliant interconnect for ultra-fine-pitch wafer level packaging

E. Liao, A. Tay, S. Ang, H. Feng, R. Nagarajan, V. Kripesh, R. Kumar, M. Iyer
{"title":"A MEMS-based compliant interconnect for ultra-fine-pitch wafer level packaging","authors":"E. Liao, A. Tay, S. Ang, H. Feng, R. Nagarajan, V. Kripesh, R. Kumar, M. Iyer","doi":"10.1109/ECTC.2006.1645812","DOIUrl":null,"url":null,"abstract":"A novel compliant flip-chip interconnect in the form of a planar microspring is presented in this paper. Different spring geometries are evaluated and compared in terms of compliances and electrical parasitics. It is shown that the J-shape spring design gives a better balanced performance. Further numerical studies reveal the geometric dependence of the compliances of J-shape spring interconnects, and also the influence of the sacrificial material upon the electrical performance of the interconnects. The wafer-level process flow for fabrication of the planar microspring interconnects is described and discussed. Prototype interconnects are fabricated by combining planar technology and 3D surface micromachining technology","PeriodicalId":194969,"journal":{"name":"56th Electronic Components and Technology Conference 2006","volume":"99 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-07-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"56th Electronic Components and Technology Conference 2006","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.2006.1645812","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

Abstract

A novel compliant flip-chip interconnect in the form of a planar microspring is presented in this paper. Different spring geometries are evaluated and compared in terms of compliances and electrical parasitics. It is shown that the J-shape spring design gives a better balanced performance. Further numerical studies reveal the geometric dependence of the compliances of J-shape spring interconnects, and also the influence of the sacrificial material upon the electrical performance of the interconnects. The wafer-level process flow for fabrication of the planar microspring interconnects is described and discussed. Prototype interconnects are fabricated by combining planar technology and 3D surface micromachining technology
用于超细间距晶圆级封装的基于mems的兼容互连
提出了一种基于平面微弹簧的柔性倒装芯片互连结构。评估和比较了不同的弹簧几何形状的顺应性和电寄生。结果表明,j型弹簧设计具有较好的平衡性能。进一步的数值研究揭示了j型弹簧互连柔度的几何依赖性,以及牺牲材料对互连电性能的影响。描述并讨论了平面微弹簧互连的晶片级工艺流程。将平面加工技术与三维表面微加工技术相结合,制备了原型互连体
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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