Flip-chip package for 28G SerDes interface

R. Wenzel, T. Zhou, S. Karako
{"title":"Flip-chip package for 28G SerDes interface","authors":"R. Wenzel, T. Zhou, S. Karako","doi":"10.1109/EPEPS.2016.7835407","DOIUrl":null,"url":null,"abstract":"This paper describes successful flip-chip package design for 28G-capable SerDes interfaces. Design optimization of the multi-layer 3D vertical BGA area is accomplished using an EM solver to obtain the best possible insertion and return losses given manufacturing capabilities. Several different stripline and microstrip pair-to-pair spacings bearing different amounts of coupling were evaluated in terms of eye opening and crosstalk-induced jitter. After full die-to-package-to-board assembly, the performance is measured up to 28G data rate. Both stripline and microstrip pairs were found to exhibit adequate performance.","PeriodicalId":241629,"journal":{"name":"2016 IEEE 25th Conference on Electrical Performance Of Electronic Packaging And Systems (EPEPS)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE 25th Conference on Electrical Performance Of Electronic Packaging And Systems (EPEPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEPS.2016.7835407","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

This paper describes successful flip-chip package design for 28G-capable SerDes interfaces. Design optimization of the multi-layer 3D vertical BGA area is accomplished using an EM solver to obtain the best possible insertion and return losses given manufacturing capabilities. Several different stripline and microstrip pair-to-pair spacings bearing different amounts of coupling were evaluated in terms of eye opening and crosstalk-induced jitter. After full die-to-package-to-board assembly, the performance is measured up to 28G data rate. Both stripline and microstrip pairs were found to exhibit adequate performance.
倒装芯片封装28G SerDes接口
本文描述了一种成功的28g SerDes接口倒装封装设计。利用EM求解器对多层三维垂直BGA区域进行了优化设计,以获得给定制造能力的最佳插入损耗和回波损耗。几种不同的带状线和微带对对间距承载不同的耦合量进行了评估,在开眼和串扰诱发抖动方面。在完全完成从芯片到封装到板的组装后,性能可达到28G数据速率。带状线和微带对都表现出足够的性能。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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