Layout-Aware Scan Chain Reorder for Skewed-Load Transition Test Coverage

Abstract

In this paper, we propose a layout-based scan chain ordering method to improve fault coverage for skewed-load delay test with minimum routing overhead. This approach provides many advantages over previous methods. (1) The proposed method can provide 100% test pair coverage for all detectable transition faults. (2) With layout information taken into account, the routing penalty is small, and thus the impact on circuit performance is not significant