{"title":"Delta-I noise avoidance methodology for high performance chip designs [CMOS microprocessors]","authors":"M. Cases, B. Singh, H. Smith","doi":"10.1109/EPEP.1997.634030","DOIUrl":null,"url":null,"abstract":"A methodology which controls induced di/dt noise for high performance chip designs is described. Delta-I modeling and analysis for the chip, module and card is used to define a strategy and effectiveness of various decoupling schemes over a broad frequency range.","PeriodicalId":220951,"journal":{"name":"Electrical Performance of Electronic Packaging","volume":"33 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-10-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electrical Performance of Electronic Packaging","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEP.1997.634030","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7
Abstract
A methodology which controls induced di/dt noise for high performance chip designs is described. Delta-I modeling and analysis for the chip, module and card is used to define a strategy and effectiveness of various decoupling schemes over a broad frequency range.