Mu-GSIM: A mutation testing simulator on GPUs

J. G. Tong, M. Boule, Z. Zilic
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引用次数: 1

Abstract

Graphics Processing Units (GPUs) have recently gained widespread usage as an advanced parallel platform for accelerating compute intensive applications. The maturity of programming interfaces and the improved programmability of GPUs have enabled the development of parallel algorithms that leverage the wealth of compute power provided by them. In this paper, we present μ-GSIM, a GPU-based simulation tool that leverages the inherent bit parallelism of GPUs for accelerating simulations of mutated digital circuits. We propose an efficient mapping of multiple mutated circuits on the GPU's device memory, where we exploit as much data parallelism as possible so our GPU simulation kernel can achieve maximal performance by operating on independent data. Results show that with the largest ITC'99 circuit benchmarks we were able to achieve a 60% decrease in memory usage while gaining a 5.4× increase in simulation performance. Additionally, we demonstrated a speedup of at least 95× against a commercial event-driven simulation tool running on a conventional processor. This is beneficial in the quest for improving test quality.
Mu-GSIM:基于gpu的突变测试模拟器
图形处理单元(gpu)作为加速计算密集型应用程序的高级并行平台,最近得到了广泛的应用。编程接口的成熟和gpu可编程性的提高使得并行算法的发展能够充分利用它们提供的计算能力。在本文中,我们提出了μ-GSIM,一个基于gpu的仿真工具,利用gpu固有的位并行性来加速突变数字电路的仿真。我们在GPU的设备内存上提出了多个突变电路的有效映射,其中我们利用尽可能多的数据并行性,因此我们的GPU仿真内核可以通过操作独立数据来实现最大的性能。结果表明,使用最大的ITC'99电路基准测试,我们能够实现内存使用减少60%,同时获得5.4倍的模拟性能提高。此外,我们还演示了在传统处理器上运行的商业事件驱动仿真工具的加速至少提高了95倍。这对于提高测试质量是有益的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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