Y. Zhou, J. Hajjar, S. Parthasarathy, D. Clarke, Brian Moane
{"title":"System Level Esd Simulation In Spice: A Holistic Approach","authors":"Y. Zhou, J. Hajjar, S. Parthasarathy, D. Clarke, Brian Moane","doi":"10.23919/EOS/ESD.2018.8509784","DOIUrl":null,"url":null,"abstract":"Compliance to system-level ESD robustness at the product level is increasingly becoming a competitive advantage. Predicting the classification test level of a design prior to fabrication is critical in achieving first pass success and also addressing key concerns in this regards. Compact models and a simulation platform have been developed to predict system-level ESD robustness.","PeriodicalId":328499,"journal":{"name":"2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/EOS/ESD.2018.8509784","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Compliance to system-level ESD robustness at the product level is increasingly becoming a competitive advantage. Predicting the classification test level of a design prior to fabrication is critical in achieving first pass success and also addressing key concerns in this regards. Compact models and a simulation platform have been developed to predict system-level ESD robustness.