Approaches and opportunities for area-selective atomic layer deposition

A. Mackus
{"title":"Approaches and opportunities for area-selective atomic layer deposition","authors":"A. Mackus","doi":"10.1109/VLSI-TSA.2018.8403864","DOIUrl":null,"url":null,"abstract":"With conventional semiconductor fabrication based on top-down processing reaching its limits in terms of patterning resolution and alignment, there is increasing interest in the implementation of bottom-up fabrication steps. In this contribution, several approaches for bottom-up processing by area-selective atomic layer deposition (ALD) will be reviewed, and the application possibilities and the main challenges in the field will be discussed.","PeriodicalId":209993,"journal":{"name":"2018 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA)","volume":"85 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSI-TSA.2018.8403864","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

With conventional semiconductor fabrication based on top-down processing reaching its limits in terms of patterning resolution and alignment, there is increasing interest in the implementation of bottom-up fabrication steps. In this contribution, several approaches for bottom-up processing by area-selective atomic layer deposition (ALD) will be reviewed, and the application possibilities and the main challenges in the field will be discussed.
区域选择性原子层沉积的方法和机会
基于自顶向下处理的传统半导体制造在图形分辨率和对准方面达到了极限,人们对自底向上制造步骤的实现越来越感兴趣。在这篇文章中,将回顾几种由区域选择性原子层沉积(ALD)自下而上加工的方法,并讨论该领域的应用可能性和主要挑战。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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