Electrical properties of ZnO/TiO2 nanocomposite film deposited by simultaneous Radio-Frequency Magnetron sputtering

I. Saurdi, M. H. Mamat, M. H. Abdullah, M. Musa, M. Rusop
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引用次数: 1

Abstract

In this work, the ZnO/TiO2 nanocomposite thin films were prepared by simultaneous Radio-Frequency Magnetron sputtering of ZnO and TiO2 targets on glass substrates at different deposition times in the range of 30-75 minutes that increases the film thickness. The electrical and surface morphology were characterized by I-V measurement and atomic force microscopy (AFM) measurement respectively. The electrical characteristics indicate that the conductivity increases as the thickness increase due to the improvement in surface contact between particles and photocatalytic activity. High conductivity at 1.67×10-4 S/cm and lowest resistivity about 5.14×104 Ω/cm have been obtained for 75 minutes deposition time. Atomic force microscopy (AFM) showed particle size of ZnO/TIO2 thin films increases from 26nm to 50nm with an increasing in deposition time.
射频磁控溅射法制备ZnO/TiO2纳米复合薄膜的电学性能
本文采用射频磁控溅射的方法,在30 ~ 75分钟的沉积时间内,将ZnO和TiO2靶材同时溅射到玻璃基板上,制备了ZnO/TiO2纳米复合薄膜。通过I-V测量和原子力显微镜(AFM)测量分别表征了材料的电学和表面形貌。电学特性表明,由于颗粒之间的表面接触和光催化活性的改善,电导率随着厚度的增加而增加。在75分钟的沉积时间内,获得了1.67×10-4 S/cm的高电导率和5.14×104 Ω/cm的最低电阻率。原子力显微镜(AFM)显示,随着沉积时间的延长,ZnO/TIO2薄膜的粒径从26nm增大到50nm。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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