T. Mitsunaka, Masafumi Yamanoue, K. Iizuka, M. Fujishima
{"title":"The effect of supply voltage reduction to 5.8-GHz differential dual-modulus prescaler","authors":"T. Mitsunaka, Masafumi Yamanoue, K. Iizuka, M. Fujishima","doi":"10.1109/IMFEDK.2013.6602226","DOIUrl":null,"url":null,"abstract":"We have measured the noise floor of spectrum and phase noise of the proposed differential dual-modulus 10/11 prescaler based on ILFD for various supply voltages and found that spurious noises arise and the phase noise degrades as the supply voltage reduces. The differential dual-modulus prescaler is implemented in 130 nm CMOS process and the core size is 40 × 20 μm2.","PeriodicalId":434595,"journal":{"name":"2013 IEEE International Meeting for Future of Electron Devices, Kansai","volume":"63 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE International Meeting for Future of Electron Devices, Kansai","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMFEDK.2013.6602226","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
We have measured the noise floor of spectrum and phase noise of the proposed differential dual-modulus 10/11 prescaler based on ILFD for various supply voltages and found that spurious noises arise and the phase noise degrades as the supply voltage reduces. The differential dual-modulus prescaler is implemented in 130 nm CMOS process and the core size is 40 × 20 μm2.