Investigation of enhanced solder wetting in 63Sn/37Pb and Sn-Ag-Cu lead free alloy

S. Anson, J.G. Slezak, K. Srihari
{"title":"Investigation of enhanced solder wetting in 63Sn/37Pb and Sn-Ag-Cu lead free alloy","authors":"S. Anson, J.G. Slezak, K. Srihari","doi":"10.1109/ECTC.2008.4550215","DOIUrl":null,"url":null,"abstract":"Enhanced or equivalent solder paste wetting on organic solderability preservative (OSP) circuit boards in 63Sn/37Pb and 96.5Sn/3.0Ag/0.5Cu at lower peak temperature and time above liquidus (TAL) has been published previously. These results are contrary to common belief and practice in microelectronics soldering. Microelectronics and general metal wetting literature will be reviewed to generate hypotheses about the cause of the enhanced or equivalent solder wetting. The former wetted area experiments were conducted using design of experiments (DOE) techniques and now analysis outside of the DOE will be conducted to test the new hypotheses and advance the knowledge of solder wetting. Industry relevant manufacturing equipment, materials and processes were used. After detailed analysis, the enhanced or equivalent wetting appears to be unique to the proprietary flux chemistry.","PeriodicalId":378788,"journal":{"name":"2008 58th Electronic Components and Technology Conference","volume":"20 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-05-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 58th Electronic Components and Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.2008.4550215","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

Enhanced or equivalent solder paste wetting on organic solderability preservative (OSP) circuit boards in 63Sn/37Pb and 96.5Sn/3.0Ag/0.5Cu at lower peak temperature and time above liquidus (TAL) has been published previously. These results are contrary to common belief and practice in microelectronics soldering. Microelectronics and general metal wetting literature will be reviewed to generate hypotheses about the cause of the enhanced or equivalent solder wetting. The former wetted area experiments were conducted using design of experiments (DOE) techniques and now analysis outside of the DOE will be conducted to test the new hypotheses and advance the knowledge of solder wetting. Industry relevant manufacturing equipment, materials and processes were used. After detailed analysis, the enhanced or equivalent wetting appears to be unique to the proprietary flux chemistry.
63Sn/37Pb和Sn-Ag-Cu无铅合金中增强焊料润湿的研究
在63Sn/37Pb和96.5Sn/3.0Ag/0.5Cu的有机可焊性防腐剂(OSP)电路板上,在较低的峰值温度和高于液相线(TAL)的时间(TAL)下,锡膏润湿增强或等效已经发表。这些结果与微电子焊接的普遍信念和实践相反。微电子和一般金属润湿文献将被审查,以产生关于增强或等效焊料润湿的原因的假设。以前的润湿区实验是使用实验设计(DOE)技术进行的,现在将在DOE之外进行分析,以测试新的假设并推进焊料润湿的知识。采用了行业相关的制造设备、材料和工艺。经过详细分析,增强或等效润湿似乎是专有的助熔剂化学所独有的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信