{"title":"Package test interface fixture considering low cost solution, high electrical performance, and compatibility with fine pitch packages","authors":"Ki-Jae Song, Hunkyo Seo, Sang-hyun Ko","doi":"10.1109/TEST.2010.5699264","DOIUrl":null,"url":null,"abstract":"This paper introduces the package test interface fixture with low cost test topology, high electrical performances, and compatibility with fine pitch packages. The proposed fixture demonstrates electrical performance using special jig and mobile DDR2.","PeriodicalId":265156,"journal":{"name":"2010 IEEE International Test Conference","volume":"222 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2010.5699264","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
This paper introduces the package test interface fixture with low cost test topology, high electrical performances, and compatibility with fine pitch packages. The proposed fixture demonstrates electrical performance using special jig and mobile DDR2.