FEM simulations for built-in reliability of innovative Liquid Crystal Polymer-based QFN packaging and Sn96.5Ag3Cu0.5 solder joint

Walide Chenniki, I. Bord-Majek, B. Levrier, K. Wongtimnoi, J. Diot, Y. Ousten
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Abstract

In this study, Quad Flat No-lead (QFN) cavity package based on LCP and the reliability impact of the package geometry are investigated. A well-established model of Sn96.5Ag3Cu0.5 solder joint fatigue based on the Darveaux's methodology leading to strain energy density estimation is used. A dedicated Design of Experiments (DoE) is performed to assess the optimal thermo-mechanical properties of the LCP package leading to the maximum operating lifetime. A correlation between predicted lifetime results and optimal thermo-mechanical properties of the package is obtained depending on the geometry of the QFN under study.
创新液晶聚合物基QFN封装和Sn96.5Ag3Cu0.5焊点内置可靠性的有限元模拟
本文研究了基于LCP的四平面无引线(QFN)空腔封装及其几何形状对可靠性的影响。建立了基于Darveaux方法的Sn96.5Ag3Cu0.5焊点疲劳模型,该模型可用于应变能密度估算。进行了专门的实验设计(DoE),以评估LCP包的最佳热机械性能,从而实现最大的使用寿命。预测寿命结果与包的最佳热机械性能之间的相关性取决于所研究的QFN的几何形状。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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