Simulated annealing Vs. Genetic Simulated Annealing for automatic transistor sizing

N. Singh, B. Ghosh
{"title":"Simulated annealing Vs. Genetic Simulated Annealing for automatic transistor sizing","authors":"N. Singh, B. Ghosh","doi":"10.1109/SMELEC.2012.6417190","DOIUrl":null,"url":null,"abstract":"Transistor size optimization is an important aspect of circuit design. Small and non-complex circuits can be designed easily using manual calculations and circuit simulations. But, as the complexity of circuits increases, manual design becomes too difficult and time consuming. Therefore, tools and techniques for automatic transistor sizing are of great importance in the area of circuit design. The goal of this paper is to implement Genetic Simulated Annealing algorithm as a tool for transistor sizing, and compare its performance with Simulated Annealing, one of the most popular optimization algorithm in use today. The algorithms have been tested on four different digital circuits and the results collated and compared in this paper.","PeriodicalId":210558,"journal":{"name":"2012 10th IEEE International Conference on Semiconductor Electronics (ICSE)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 10th IEEE International Conference on Semiconductor Electronics (ICSE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SMELEC.2012.6417190","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

Transistor size optimization is an important aspect of circuit design. Small and non-complex circuits can be designed easily using manual calculations and circuit simulations. But, as the complexity of circuits increases, manual design becomes too difficult and time consuming. Therefore, tools and techniques for automatic transistor sizing are of great importance in the area of circuit design. The goal of this paper is to implement Genetic Simulated Annealing algorithm as a tool for transistor sizing, and compare its performance with Simulated Annealing, one of the most popular optimization algorithm in use today. The algorithms have been tested on four different digital circuits and the results collated and compared in this paper.
模拟退火与遗传模拟退火的自动晶体管尺寸
晶体管尺寸优化是电路设计的一个重要方面。小型和非复杂的电路可以很容易地设计使用人工计算和电路模拟。但是,随着电路复杂性的增加,手工设计变得过于困难和耗时。因此,自动晶体管尺寸的工具和技术在电路设计领域是非常重要的。本文的目标是实现遗传模拟退火算法作为晶体管尺寸的工具,并将其性能与模拟退火算法进行比较,模拟退火算法是当今最流行的优化算法之一。本文在四种不同的数字电路上对算法进行了测试,并对结果进行了整理和比较。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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