Holistic IJTAG-based External and Internal Fault Monitoring in UAVs

Foisal Ahmed, M. Jenihhin
{"title":"Holistic IJTAG-based External and Internal Fault Monitoring in UAVs","authors":"Foisal Ahmed, M. Jenihhin","doi":"10.1109/LATS58125.2023.10154489","DOIUrl":null,"url":null,"abstract":"Cyber-Physical Systems (CPSs), such as Unmanned Aerial Vehicles (UAVs), use System-on-Chip (SoC) based computing platforms to perform multiple complex tasks in safety-critical applications that require a highly dependable operation. Due to continuous technological manufacturing miniaturization SoCs face a wide spectrum of chip-level reliability issues such as aging, soft and hard errors during the operational lifetime of a UAV. In addition, external (off-chip) faults in the sensors, actuators, and motors are another cause of UAV failures. While existing works examine either on-chip faults (internal) or sensors/actuators faults (external) separately, this research proposes a UAV health monitoring infrastructure considering both external and internal faults holistically. The proposed method relies on the IEEE 1687 standard (IJTAG) and employs on-chip embedded instruments as health monitors to instantly access external and internal sensor data. Experimental results for functional simulation of a real-life case-study design demonstrate both types of fault detection by serving only three clock cycles and the localization process using 16 and 30 clock cycles for the case of single and double faults, respectively.","PeriodicalId":145157,"journal":{"name":"2023 IEEE 24th Latin American Test Symposium (LATS)","volume":"248 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-03-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 IEEE 24th Latin American Test Symposium (LATS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/LATS58125.2023.10154489","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

Cyber-Physical Systems (CPSs), such as Unmanned Aerial Vehicles (UAVs), use System-on-Chip (SoC) based computing platforms to perform multiple complex tasks in safety-critical applications that require a highly dependable operation. Due to continuous technological manufacturing miniaturization SoCs face a wide spectrum of chip-level reliability issues such as aging, soft and hard errors during the operational lifetime of a UAV. In addition, external (off-chip) faults in the sensors, actuators, and motors are another cause of UAV failures. While existing works examine either on-chip faults (internal) or sensors/actuators faults (external) separately, this research proposes a UAV health monitoring infrastructure considering both external and internal faults holistically. The proposed method relies on the IEEE 1687 standard (IJTAG) and employs on-chip embedded instruments as health monitors to instantly access external and internal sensor data. Experimental results for functional simulation of a real-life case-study design demonstrate both types of fault detection by serving only three clock cycles and the localization process using 16 and 30 clock cycles for the case of single and double faults, respectively.
基于ijtag的无人机内外故障整体监测
网络物理系统(cps),如无人机(uav),使用基于片上系统(SoC)的计算平台,在需要高度可靠操作的安全关键应用中执行多个复杂任务。由于持续的技术制造小型化,soc面临着广泛的芯片级可靠性问题,如老化,在无人机的使用寿命期间的软错误和硬错误。此外,传感器、执行器和电机中的外部(芯片外)故障是UAV故障的另一个原因。虽然现有的工作分别检查芯片上故障(内部)或传感器/执行器故障(外部),但本研究提出了一种综合考虑外部和内部故障的无人机健康监测基础设施。该方法基于IEEE 1687标准(IJTAG),采用片上嵌入式仪器作为健康监视器,实时访问外部和内部传感器数据。实际案例研究设计的功能模拟实验结果表明,两种类型的故障检测仅使用三个时钟周期,定位过程分别使用16和30个时钟周期,用于单故障和双故障的情况。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信