Reliable, compact, CMOS interface, 200-Mbit/s a 12-channel optical interconnects using single-mode fiber arrays

A. Miura, K. Tonehira, A. Takai, S. Aoki, S. Kaneko, H. Irie, S. Hanatani
{"title":"Reliable, compact, CMOS interface, 200-Mbit/s a 12-channel optical interconnects using single-mode fiber arrays","authors":"A. Miura, K. Tonehira, A. Takai, S. Aoki, S. Kaneko, H. Irie, S. Hanatani","doi":"10.1109/ECTC.1997.606173","DOIUrl":null,"url":null,"abstract":"We developed 200-Mbit/s/ch, 12-ch, 100-m, +3.3 V CMOS interface, fully integrated optical interconnects using single-mode fiber arrays, planar micro-lens arrays and 1.6-mA-threshold-current 1.3 /spl mu/m laser diode (LD) arrays. Skew and BER measurement and reliability test result confirmed the reliable optical interconnects for communication and computer systems in practical use.","PeriodicalId":339633,"journal":{"name":"1997 Proceedings 47th Electronic Components and Technology Conference","volume":"15 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1997 Proceedings 47th Electronic Components and Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.1997.606173","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7

Abstract

We developed 200-Mbit/s/ch, 12-ch, 100-m, +3.3 V CMOS interface, fully integrated optical interconnects using single-mode fiber arrays, planar micro-lens arrays and 1.6-mA-threshold-current 1.3 /spl mu/m laser diode (LD) arrays. Skew and BER measurement and reliability test result confirmed the reliable optical interconnects for communication and computer systems in practical use.
可靠,紧凑,CMOS接口,200 mbit /s的12通道光互连使用单模光纤阵列
我们开发了200mbit /s/ch, 12ch, 100m, +3.3 V的CMOS接口,采用单模光纤阵列,平面微透镜阵列和1.6 ma阈值电流1.3 /spl μ l /m激光二极管(LD)阵列的全集成光互连。斜度和误码率测量和可靠性测试结果验证了实际应用中通信和计算机系统的可靠光互连。
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