Reliability assessments of BGA solder joints under cyclic bending loads

Il-ho Kim, Soon-Bok Lee
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引用次数: 6

Abstract

Mobile products, such as cellular phones, PDA and notebook, are subjected to many different mechanical loads, which include bending, twisting, impact shock and vibration. In this study, a cyclic bending test of the BGA package was performed to evaluate the fatigue life. Special bending tester, which was suitable for electronic package, was developed using an electromagnetic actuator. A nonlinear finite element model was used to simulate the mechanical bending deformation of solder joint in BGA packages. The fatigue life of lead-free (95.5Sn4.0Ag0.5Cu) solder joints was compared with that of lead-contained (63Sn37Pb). When the applied load to the specimen is small, the lead-free solder has longer fatigue life than lead-contained solder.
循环弯曲载荷下BGA焊点可靠性评估
移动产品,如手机,PDA和笔记本电脑,受到许多不同的机械载荷,包括弯曲,扭曲,冲击和振动。在本研究中,对BGA封装进行了循环弯曲试验,以评估其疲劳寿命。采用电磁作动器,研制了适用于电子封装的专用弯曲试验机。采用非线性有限元模型模拟了BGA封装中焊点的机械弯曲变形。比较了无铅(95.5Sn4.0Ag0.5Cu)焊点与含铅(63Sn37Pb)焊点的疲劳寿命。当试样所受载荷较小时,无铅焊料比含铅焊料具有更长的疲劳寿命。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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