Failure Analysis and Optimization of Metal Fuses for Post Package Trimming

Yu-Hsing Cheng, C. Kendrick
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引用次数: 4

Abstract

Post package trimming is important in achieving precise control of circuit parameters that may shift due to package stresses. However, the size of on-chip driver circuitry must be minimized while still maintaining reliably trimmed fuses. This study presents a statistical analysis and physical characterization of trimmed fuses to optimize fuse geometry and trimming conditions.
后包装修边金属熔断器失效分析与优化
后封装修剪是重要的,以实现精确控制电路参数,可能会转移由于封装应力。然而,片上驱动电路的尺寸必须最小化,同时仍然保持可靠的修剪保险丝。本研究提出了统计分析和修剪引信的物理特性,以优化引信的几何形状和修剪条件。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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