{"title":"Microwave/mm-Wave imaging systems","authors":"S. Ahmed","doi":"10.1109/BCTM.2013.6798142","DOIUrl":null,"url":null,"abstract":"The interest in microwave and mm-wave imaging systems is continuously increasing. Synthetic aperture radar (SAR) used by satellite remote sensing has driven the development of microwave imaging techniques since many decades. In the meanwhile, technological advances in the manufacturing of semiconductors allow for affordable imaging solutions not only for satellites, but also for the daily use. Imaging for security applications has been in focus since some years; currently systems are also in development to address the need for non-destructive testing and evaluation (NDT&E) demands. This paper discusses the requirements behind the realization of active microwave imaging systems in order to align the modern capabilities of semiconductor manufacturing with the actual demands for efficient imaging systems.","PeriodicalId":272941,"journal":{"name":"2013 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM)","volume":"51 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/BCTM.2013.6798142","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
The interest in microwave and mm-wave imaging systems is continuously increasing. Synthetic aperture radar (SAR) used by satellite remote sensing has driven the development of microwave imaging techniques since many decades. In the meanwhile, technological advances in the manufacturing of semiconductors allow for affordable imaging solutions not only for satellites, but also for the daily use. Imaging for security applications has been in focus since some years; currently systems are also in development to address the need for non-destructive testing and evaluation (NDT&E) demands. This paper discusses the requirements behind the realization of active microwave imaging systems in order to align the modern capabilities of semiconductor manufacturing with the actual demands for efficient imaging systems.