Inter-dependence of processing and alloy composition on the reliability of Sn-based lead free solders in fine pitch FCOB interconnection

Zhiheng Huang, P. Conway, Changqing Liu, R. Thomson
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引用次数: 5

Abstract

Market demands and legislation are driving the electronics manufacturing sector to move rapidly toward for a lead free future, with Pb containing electronics products are to be banned in Europe from 2006. The UK readiness for joining global actions to enable this 'green' packaging urgently requires the replacement of SnPb with suitable lead free alloys. Although the related scientific research has been undertaken for a decade, a number of technical complications still exist, which are further exaggerated due to the concurrent developments of the new technologies needed for the miniaturisation and multi-functionality of microelectronic products. As the packaging joint geometry shrinks towards a microscopic scale, the joint fabrication and reliability become extremely sensitive to the composition and resulting microstructure generated from an essentially hybrid joining process. The current level of understanding on such issues is still in its infancy and therefore requires further fundamental study. Thermodynamic modelling is employed in this work as a major computational tool to study the sensitivity of processing ranges (e.g. reflow temperature) and the resultant reliability of the micro-joints by changing the alloying elements and their content in Sn-based lead-free systems. The work is implemented using the MTDATA program developed by the National Physical Laboratory (NPL), UK. With a newly-developed database containing critically assessed thermodynamic data appropriate for lead free solder systems, MTDATA allows the prediction of the dependence of the liquid-solid transformation and phase formation, for example, as a function of chemical composition and temperature. The paper emphasises the formation and mass fraction of intermetallic precipitates of different phases in the bulk solder joints and the modelling is also validated through carefully designed experimental work and recent literature. The results are expected to assist the optimisation of processing parameters and cost-effective production using lead free solders.
细间距FCOB互连中sn基无铅焊料的可靠性受工艺和合金成分的影响
欧洲将从2006年开始禁止使用含铅电子产品,市场需求和法律正在推动电子制造业迅速走向无铅的未来。英国准备加入全球行动,使这种“绿色”包装迫切需要用合适的无铅合金取代SnPb。虽然相关的科学研究已经进行了十年,但一些技术上的复杂性仍然存在,由于微电子产品小型化和多功能性所需的新技术的同步发展,这些问题进一步被夸大了。当封装接头的几何形状缩小到微观尺度时,接头的制造和可靠性对混合连接过程产生的成分和微观结构变得极其敏感。目前对这些问题的认识水平还处于初级阶段,因此需要进一步的基础研究。本研究采用热力学模型作为主要计算工具,通过改变锡基无铅体系中合金元素及其含量来研究加工范围(如回流温度)的敏感性以及由此产生的微接头可靠性。这项工作是使用由英国国家物理实验室(NPL)开发的MTDATA程序实施的。新开发的数据库包含了严格评估的适用于无铅焊料系统的热力学数据,MTDATA可以预测液固转变和相形成的依赖关系,例如,作为化学成分和温度的函数。本文着重研究了大块焊点中不同相金属间析出物的形成和质量分数,并通过精心设计的实验工作和最新文献验证了模型的有效性。该结果有望帮助优化加工参数和使用无铅焊料的经济高效生产。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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