{"title":"The atomic structure of the NiSi2/(001) Si interface","authors":"C. Hetherington, D. Cherns, C. Humphreys","doi":"10.1201/9781003069614-14","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":103093,"journal":{"name":"Microscopy of Semiconducting Materials, 1983","volume":"69 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-11-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microscopy of Semiconducting Materials, 1983","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1201/9781003069614-14","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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