Reliability of compound semiconductor workshop historical review

Abstract

This discussion is meant to look back at reliability progress over the last two decades and identify a few items that have been learned. While the Workshop addresses various specific Issues individually, It is the accumulation of a variety of data, information, and experience which forms the basis of an assessment of reliability. In the end, reliability is simply an insightful perception of facts and statistics. After 20 years of Workshop meetings, it is time to review, compare, and discuss the progress and the future of Compound Semiconductor Reliability.