2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual.

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2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual. - 最新文献

Practical WLRC methodology & applications in a wafer foundry

Pub Date : 2003-05-13 DOI: 10.1109/RELPHY.2003.1197780 W. Chien, Shunwang Chiang, S. Tseng, C.H.J. Huang, K. Yang, W. Wang, J. Zhou

Transient effects and characterization methodology of negative bias temperature instability in pMOS transistors

Pub Date : 2003-05-13 DOI: 10.1109/RELPHY.2003.1197828 M. Ershov, R. Lindley, S. Saxena, A. Shibkov, S. Minehane, J. Babcock, S. Winters, H. Karbasi, T. Yamashita, P. Clifton, M. Redford

Degradation of tunnel oxide by FN current stress and its effects on data retention characteristics of 90 nm NAND flash memory cells

Pub Date : 2003-05-13 DOI: 10.1109/RELPHY.2003.1197798 Jaeduk Lee, Jeong-Hyuk Choi, Donggun Park, Kinam Kim

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