Tae-Han Kim, In-Ho Kim, Seung Joo Kang, Miyoung Choi, Baek-Hui Kim, Bang Wool Eom, Bum Jun Kim, Byung-Hoon Min, Chang In Choi, Cheol Min Shin, Chung Hyun Tae, Chung Sik Gong, Dong Jin Kim, Arthur Eung-Hyuck Cho, Eun Jeong Gong, Geum Jong Song, Hyeon-Su Im, Hye Seong Ahn, Hyun Lim, Hyung-Don Kim, Jae-Joon Kim, Jeong Il Yu, Jeong Won Lee, Ji Yeon Park, Jwa Hoon Kim, Kyoung Doo Song, Minkyu Jung, Mi Ran Jung, Sang-Yong Son, Shin-Hoo Park, Soo Jin Kim, Sung Hak Lee, Tae-Yong Kim, Woo Kyun Bae, Woong Sub Koom, Yeseob Jee, Yoo Min Kim, Yoonjin Kwak, Young Suk Park, Hye Sook Han, Su Youn Nam, Seong-Ho Kong
{"title":"韩国2022年胃癌实践指南:基于证据的多学科方法。","authors":"Tae-Han Kim, In-Ho Kim, Seung Joo Kang, Miyoung Choi, Baek-Hui Kim, Bang Wool Eom, Bum Jun Kim, Byung-Hoon Min, Chang In Choi, Cheol Min Shin, Chung Hyun Tae, Chung Sik Gong, Dong Jin Kim, Arthur Eung-Hyuck Cho, Eun Jeong Gong, Geum Jong Song, Hyeon-Su Im, Hye Seong Ahn, Hyun Lim, Hyung-Don Kim, Jae-Joon Kim, Jeong Il Yu, Jeong Won Lee, Ji Yeon Park, Jwa Hoon Kim, Kyoung Doo Song, Minkyu Jung, Mi Ran Jung, Sang-Yong Son, Shin-Hoo Park, Soo Jin Kim, Sung Hak Lee, Tae-Yong Kim, Woo Kyun Bae, Woong Sub Koom, Yeseob Jee, Yoo Min Kim, Yoonjin Kwak, Young Suk Park, Hye Sook Han, Su Youn Nam, Seong-Ho Kong","doi":"10.5230/jgc.2023.23.e20","DOIUrl":null,"url":null,"abstract":"<p><p>This corrects the article on p. 3 in vol. 23, PMID: 36750993.</p>","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":null,"pages":null},"PeriodicalIF":4.3000,"publicationDate":"2023-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ftp.ncbi.nlm.nih.gov/pub/pmc/oa_pdf/d0/4a/jgc-23-365.PMC10154136.pdf","citationCount":"22","resultStr":"{\"title\":\"Erratum: Korean Practice Guidelines for Gastric Cancer 2022: An Evidence-based, Multidisciplinary Approach.\",\"authors\":\"Tae-Han Kim, In-Ho Kim, Seung Joo Kang, Miyoung Choi, Baek-Hui Kim, Bang Wool Eom, Bum Jun Kim, Byung-Hoon Min, Chang In Choi, Cheol Min Shin, Chung Hyun Tae, Chung Sik Gong, Dong Jin Kim, Arthur Eung-Hyuck Cho, Eun Jeong Gong, Geum Jong Song, Hyeon-Su Im, Hye Seong Ahn, Hyun Lim, Hyung-Don Kim, Jae-Joon Kim, Jeong Il Yu, Jeong Won Lee, Ji Yeon Park, Jwa Hoon Kim, Kyoung Doo Song, Minkyu Jung, Mi Ran Jung, Sang-Yong Son, Shin-Hoo Park, Soo Jin Kim, Sung Hak Lee, Tae-Yong Kim, Woo Kyun Bae, Woong Sub Koom, Yeseob Jee, Yoo Min Kim, Yoonjin Kwak, Young Suk Park, Hye Sook Han, Su Youn Nam, Seong-Ho Kong\",\"doi\":\"10.5230/jgc.2023.23.e20\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p><p>This corrects the article on p. 3 in vol. 23, PMID: 36750993.</p>\",\"PeriodicalId\":3,\"journal\":{\"name\":\"ACS Applied Electronic Materials\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":4.3000,\"publicationDate\":\"2023-04-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://ftp.ncbi.nlm.nih.gov/pub/pmc/oa_pdf/d0/4a/jgc-23-365.PMC10154136.pdf\",\"citationCount\":\"22\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ACS Applied Electronic Materials\",\"FirstCategoryId\":\"3\",\"ListUrlMain\":\"https://doi.org/10.5230/jgc.2023.23.e20\",\"RegionNum\":3,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACS Applied Electronic Materials","FirstCategoryId":"3","ListUrlMain":"https://doi.org/10.5230/jgc.2023.23.e20","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}