硅原子与SiCl4反应的激波管研究

A. Kunz, P. Roth
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引用次数: 5

摘要

采用原子共振吸收光谱(ARAS)对Si原子进行时间分辨测量,研究了在1530 ~ 1800k温度和1.7 bar压力下,Si原子与SiCl4在反射激波下的反应。利用少量ppm Si2H6的热分解作为硅原子的来源。过量SiCl4的存在导致Si原子的快速消耗,这遵循伪一阶速率定律。测定了Si原子与SiCl4反应的速率系数为:k1 = 4.0±0.2×1013cm3 mol−1s−1,在本研究的温度范围内无明显的温度依赖性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Shock Tube Study of the Reaction of Si Atoms with SiCl4

Shock Tube Study of the Reaction of Si Atoms with SiCl4

The reaction of Si atoms with SiCl4 was studied behind reflected shock waves at temperatures between 1530 and 1800 K and pressures around 1.7 bar by applying atomic resonance absorption spectroscopy (ARAS) for time-resolved measurement of Si atoms. The thermal decomposition of a few ppm Si2H6 was used as source for Si-atoms. The presence of an excess of SiCl4 causes a fast consumption of Si atoms, which follows a pseudo-first-order rate law. The rate coefficient for the reaction of Si atoms with SiCl4

was determined to be:

k1 = 4.0±0.2×1013cm3 mol−1s−1

with no observable temperature dependence in the temperature range of the present study.

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