使用数据挖掘预测系统级测试和现场客户故障

2013 IEEE International Test Conference (ITC) Pub Date : 2013-11-04 DOI:10.1109/TEST.2013.6651892

Harry H. Chen, R. Hsu, PaulYoung Yang, J. Shyr

{"title":"使用数据挖掘预测系统级测试和现场客户故障","authors":"Harry H. Chen, R. Hsu, PaulYoung Yang, J. Shyr","doi":"10.1109/TEST.2013.6651892","DOIUrl":null,"url":null,"abstract":"This paper describes our deployment of data mining techniques during final test to predict system level test failures and customer returns for two recent mixed-signal system-on-chip products. Emphasis is put on practical considerations for simplifying test flow implementation while still meeting the twin goals of reduced test cost and improved product quality.","PeriodicalId":6379,"journal":{"name":"2013 IEEE International Test Conference (ITC)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2013-11-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"29","resultStr":"{\"title\":\"Predicting system-level test and in-field customer failures using data mining\",\"authors\":\"Harry H. Chen, R. Hsu, PaulYoung Yang, J. Shyr\",\"doi\":\"10.1109/TEST.2013.6651892\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes our deployment of data mining techniques during final test to predict system level test failures and customer returns for two recent mixed-signal system-on-chip products. Emphasis is put on practical considerations for simplifying test flow implementation while still meeting the twin goals of reduced test cost and improved product quality.\",\"PeriodicalId\":6379,\"journal\":{\"name\":\"2013 IEEE International Test Conference (ITC)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-11-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"29\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 IEEE International Test Conference (ITC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.2013.6651892\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE International Test Conference (ITC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2013.6651892","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 29

摘要

本文描述了我们在最后测试中部署的数据挖掘技术，以预测两种最近的混合信号片上系统产品的系统级测试失败和客户回报。重点放在简化测试流程实施的实际考虑，同时仍然满足降低测试成本和提高产品质量的双重目标。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Predicting system-level test and in-field customer failures using data mining

This paper describes our deployment of data mining techniques during final test to predict system level test failures and customer returns for two recent mixed-signal system-on-chip products. Emphasis is put on practical considerations for simplifying test flow implementation while still meeting the twin goals of reduced test cost and improved product quality.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2013 IEEE International Test Conference (ITC)

自引率

0.00%

发文量