环境友好型MEMS制造:提出新的D-RIE工艺气体以减少温室效应

S. Nagano, T. Shibata, K. Sakoda, M. Inoue, S. Hasaka, T. Takano, T. Ikehara, R. Maeda
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引用次数: 1

摘要

随着MEMS市场的增长,MEMS制造过程中硅深刻蚀过程所消耗的SF6和C4F8等温室气体的环境排放量也在增加。为了减少温室气体的排放,研究了C3F6和IF5替代传统博世工艺气体用于MEMS蚀刻工艺。C3F6和IF5气体具有非常小的全球变暖潜势,因此它们有助于减少95%以上的温室气体,在蚀刻速率和蚀刻剖面上保持良好的蚀刻性能。据估计,在晶圆片的一次蚀刻过程中,新气体减少了大约43棵树的温室气体排放,达到300棵树。除此之外,IF5还可以应用于非博世工艺的各向异性沟槽刻蚀。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Environment friendly MEMS fabrication: Proposal of new D-RIE process gases for reduction of green house effect
Environmental emission volume of green house gases such as SF6 and C4F8, consumed for Si deep etching process in MEMS fabrication, are increasing followed by the MEMS market growth. To reduce the emitted green house gases, alternative C3F6 and IF5 were investigated to be applied for MEMS etching process instead of conventional Bosch process gases. The C3F6 and IF5 gases have very small global warming potential, so that they were useful to reduce over 95% of the green house gases maintaining the good etching performance on both etching rate and etching profile. The reduction of warming gas emission by the new gases is estimated that approximately 43 trees might be conserved during one etching process of a wafer to 300 mum. In addition to this merit, IF5 is found to be applied for anisotropic trench etching without Bosch process.
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