缺陷像素的自适应检测与隐藏算法

Jeehoon An, Wonjae Lee, Jaeseok Kim
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引用次数: 14

摘要

提出了一种CCD/CMOS图像传感器缺陷像素检测算法及其硬件结构。在以前的算法中,没有考虑到图像的特征,正常像素有很大的可能被视为缺陷像素。为了弥补这些缺点,该算法通过考虑图像的特征来检测缺陷像素,并在检查场景变化的同时使用几帧进行验证。每当场景发生变化时,就会检测并验证潜在的缺陷像素。采用Verilog HDL实现了该算法。使用0.25um CMOS标准单元库,总逻辑门计数为5.1k。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Adaptive Detection and Concealment Algorithm of Defective Pixel
This paper proposes a defective pixel detection algorithm for CCD/CMOS image sensors and its hardware architecture. In previous algorithms, the characteristics of images have not been considered and normal pixels can be treated as defective pixels with high possibility. In order to make up for those disadvantages, the proposed algorithm detects defective pixels by considering the characteristics of the image and verifies them using several frames while checking scene-changes. Whenever a scene-change is occurred, potentially defective pixels are detected and verified. The proposed algorithm was implemented with Verilog HDL. Total logic gate count was 5.1k using 0.25um CMOS standard cell library.
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