基于场调制的双栅极IGZO源门控晶体管的TCAD仿真

Ning Li, Zhao Rong, Lining Zhang, Min Zhang
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引用次数: 0

摘要

本文提出一种基于肖特基触点场调制的可配置铟镓锌氧化物源门控晶体管(SGT)。通过TCAD数值模拟对器件概念进行了评价,并对相关参数进行了讨论。结果表明,SGT器件可以通过通道调制门和接触调制门两个栅极的电压调节来实现,其饱和电压和饱和电流在较宽的范围内受到明显的调制。虽然金属工程设计可能会受到费米水平钉住的影响,但所提出的器件为SGT在低功耗有源显示电路中的应用提供了一种设计优化的替代方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A dual-gate IGZO Source-Gated transistor based on field modulation by TCAD simulation
In this work, a configurable indium-gallium-zinc-oxide source-gated transistors (SGT) is proposed based on the field modulation of schottky contacts. The device concept is evaluated through TCAD numerical device simulations and related parameters are discussed. The results show that the SGT device can be achieved by voltage regulation of two gates, the channel modulation gate and contact modulation gate, and that its saturation voltage and current are under a significant modulation within a wide range. While designs with metal engineering may suffer from Fermi level pinning, the proposed device provides an alternative method for design optimizations of SGT for their applications in low-power active-display circuits.
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