精密温度测量单元，用于低温介电计

2016 9th International Kharkiv Symposium on Physics and Engineering of Microwaves, Millimeter and Submillimeter Waves (MSMW) Pub Date : 2016-06-20 DOI:10.1109/MSMW.2016.7538104

R. Golovashchenko, N. K. Zaetz, Y. Ostryzhnyi, A. S. Plevako, V. Derkach

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引用次数: 0

摘要

给出了在0.3 ~ 300 K范围内对所研究样品进行温度测量的精密测温装置的描述，测量精度为0.05 K。采用半导体温度传感器(半导体薄膜电阻温度计)实现了交流电四线制测量电路的全温度范围。利用所设计的装置，在毫米波长范围和较宽温度范围内测量了多种低损耗材料的介电损耗。给出了掺金硅(Si:Au)中介电损耗随温度变化的例子。

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Precision temperature measurement unit for the low temperature dielectrometer

The description of the precision temperature measurement unit for measuring temperature of the investigated samples in the low-temperature dielectrometer in the range of 0.3 - 300 K with an accuracy of 0.05 K is given. Four-wire measurement circuit on an alternating current with use of the semiconductor temperature sensor (semiconductor film resistance thermometer) in the whole temperature range is implemented. The dielectric losses in a number of low-loss materials were measured in the millimeter wavelength range and a wide temperature range by using the designed unit. The example of the temperature dependence of the dielectric loss in gold doped silicon (Si:Au) is given.

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2016 9th International Kharkiv Symposium on Physics and Engineering of Microwaves, Millimeter and Submillimeter Waves (MSMW)

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