{"title":"0.50 Bi/sub 2/O/sub 3/-0.25 V/sub 2/O/sub 5/-0.25 SrB/sub 4/O/sub 7/玻璃陶瓷的结构和介电特性","authors":"M. Shankar, K. Varma","doi":"10.1109/ISAF.1996.598149","DOIUrl":null,"url":null,"abstract":"Novel 0.50 Bi/sub 2/O/sub 3/-0.25 V/sub 2/O/sub 5/-0.25 SrB/sub 4/O/sub 7/ glasses have been prepared via a conventional splat-quenching technique. Differential thermal analysis (DTA) carried out on the as-quenched samples confirms their glassy nature and shows a prominent exothermic peak at 400/spl deg/C. The X-ray powder diffraction (XRD) pattern of the heat treated sample could be indexed to an orthorhombic ferroelectric Bi/sub 2/VO/sub 5.5/ phase with the lattice parameters a=5.543, b=5.615 and c=15.321 A. The presence of nano-crystallites of bismuth vanadate, Bi/sub 2/VO/sub 5.5/ (BiV) dispersed in the glassy matrix of strontium tetraborate, SrB/sub 4/O/sub 7/ (SBO) is confirmed in the heat treated (at 400/spl deg/C for 12 h) samples, by high resolution transmission electron microscopy (HRTEM). The dielectric constant (/spl epsiv//sub /spl tau//), measured as a function of temperature, exhibits an anomaly around the transition temperature of the parent crystalline BiV. The /spl epsiv//sub /spl tau// of the glass-ceramic at 300K is comparable with that predicted by Maxwell's model and logarithmic mixture rule.","PeriodicalId":14772,"journal":{"name":"ISAF '96. Proceedings of the Tenth IEEE International Symposium on Applications of Ferroelectrics","volume":"1 1","pages":"817-820 vol.2"},"PeriodicalIF":0.0000,"publicationDate":"1996-08-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Structural and dielectric characteristics of 0.50 Bi/sub 2/O/sub 3/-0.25 V/sub 2/O/sub 5/-0.25 SrB/sub 4/O/sub 7/ glass-ceramic\",\"authors\":\"M. Shankar, K. Varma\",\"doi\":\"10.1109/ISAF.1996.598149\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Novel 0.50 Bi/sub 2/O/sub 3/-0.25 V/sub 2/O/sub 5/-0.25 SrB/sub 4/O/sub 7/ glasses have been prepared via a conventional splat-quenching technique. Differential thermal analysis (DTA) carried out on the as-quenched samples confirms their glassy nature and shows a prominent exothermic peak at 400/spl deg/C. The X-ray powder diffraction (XRD) pattern of the heat treated sample could be indexed to an orthorhombic ferroelectric Bi/sub 2/VO/sub 5.5/ phase with the lattice parameters a=5.543, b=5.615 and c=15.321 A. The presence of nano-crystallites of bismuth vanadate, Bi/sub 2/VO/sub 5.5/ (BiV) dispersed in the glassy matrix of strontium tetraborate, SrB/sub 4/O/sub 7/ (SBO) is confirmed in the heat treated (at 400/spl deg/C for 12 h) samples, by high resolution transmission electron microscopy (HRTEM). The dielectric constant (/spl epsiv//sub /spl tau//), measured as a function of temperature, exhibits an anomaly around the transition temperature of the parent crystalline BiV. The /spl epsiv//sub /spl tau// of the glass-ceramic at 300K is comparable with that predicted by Maxwell's model and logarithmic mixture rule.\",\"PeriodicalId\":14772,\"journal\":{\"name\":\"ISAF '96. Proceedings of the Tenth IEEE International Symposium on Applications of Ferroelectrics\",\"volume\":\"1 1\",\"pages\":\"817-820 vol.2\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-08-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ISAF '96. Proceedings of the Tenth IEEE International Symposium on Applications of Ferroelectrics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISAF.1996.598149\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ISAF '96. Proceedings of the Tenth IEEE International Symposium on Applications of Ferroelectrics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISAF.1996.598149","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Structural and dielectric characteristics of 0.50 Bi/sub 2/O/sub 3/-0.25 V/sub 2/O/sub 5/-0.25 SrB/sub 4/O/sub 7/ glass-ceramic
Novel 0.50 Bi/sub 2/O/sub 3/-0.25 V/sub 2/O/sub 5/-0.25 SrB/sub 4/O/sub 7/ glasses have been prepared via a conventional splat-quenching technique. Differential thermal analysis (DTA) carried out on the as-quenched samples confirms their glassy nature and shows a prominent exothermic peak at 400/spl deg/C. The X-ray powder diffraction (XRD) pattern of the heat treated sample could be indexed to an orthorhombic ferroelectric Bi/sub 2/VO/sub 5.5/ phase with the lattice parameters a=5.543, b=5.615 and c=15.321 A. The presence of nano-crystallites of bismuth vanadate, Bi/sub 2/VO/sub 5.5/ (BiV) dispersed in the glassy matrix of strontium tetraborate, SrB/sub 4/O/sub 7/ (SBO) is confirmed in the heat treated (at 400/spl deg/C for 12 h) samples, by high resolution transmission electron microscopy (HRTEM). The dielectric constant (/spl epsiv//sub /spl tau//), measured as a function of temperature, exhibits an anomaly around the transition temperature of the parent crystalline BiV. The /spl epsiv//sub /spl tau// of the glass-ceramic at 300K is comparable with that predicted by Maxwell's model and logarithmic mixture rule.
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