Zack Hatfield, A. S. Peter, C. Dávila-Peralta, Joel Berkson, Daewook Kim, J. Hyatt
{"title":"毫米波天线面板的自适应热成形与结构设计","authors":"Zack Hatfield, A. S. Peter, C. Dávila-Peralta, Joel Berkson, Daewook Kim, J. Hyatt","doi":"10.1007/s41871-022-00169-z","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":52345,"journal":{"name":"Nanomanufacturing and Metrology","volume":"128 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2022-10-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Adaptive Thermoforming and Structural Design of Millimeter-Wave Antenna Panels\",\"authors\":\"Zack Hatfield, A. S. Peter, C. Dávila-Peralta, Joel Berkson, Daewook Kim, J. Hyatt\",\"doi\":\"10.1007/s41871-022-00169-z\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":52345,\"journal\":{\"name\":\"Nanomanufacturing and Metrology\",\"volume\":\"128 1\",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-10-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Nanomanufacturing and Metrology\",\"FirstCategoryId\":\"1089\",\"ListUrlMain\":\"https://doi.org/10.1007/s41871-022-00169-z\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"Engineering\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Nanomanufacturing and Metrology","FirstCategoryId":"1089","ListUrlMain":"https://doi.org/10.1007/s41871-022-00169-z","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"Engineering","Score":null,"Total":0}
期刊介绍:
Nanomanufacturing and Metrology is a peer-reviewed, international and interdisciplinary research journal and is the first journal over the world that provides a principal forum for nano-manufacturing and nano-metrology.Nanomanufacturing and Metrology publishes in the forms including original articles, cutting-edge communications, timely review papers, technical reports, and case studies. Special issues devoted to developments in important topics in nano-manufacturing and metrology will be published periodically.Nanomanufacturing and Metrology publishes articles that focus on, but are not limited to, the following areas:• Nano-manufacturing and metrology• Atomic manufacturing and metrology• Micro-manufacturing and metrology• Physics, chemistry, and materials in micro-manufacturing, nano-manufacturing, and atomic manufacturing• Tools and processes for micro-manufacturing, nano-manufacturing and atomic manufacturing