{"title":"一个宽带可扩展的集总元件电感模型,使用解析表达式来考虑趋肤效应、衬底损耗和邻近效应","authors":"F. Rotella, V. Blaschke, D. Howard","doi":"10.1109/IEDM.2002.1175881","DOIUrl":null,"url":null,"abstract":"A new broad-band scalable spiral inductor model incorporating skin effect, substrate loss, and proximity effect is presented. The construction of the lumped element model using analytic expressions is described and the model is validated with data from multiple technologies. Extensions to differential inductors with measured validation is also provided.","PeriodicalId":74909,"journal":{"name":"Technical digest. International Electron Devices Meeting","volume":"122 1","pages":"471-474"},"PeriodicalIF":0.0000,"publicationDate":"2002-12-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"30","resultStr":"{\"title\":\"A broad-band scalable lumped-element inductor model using analytic expressions to incorporate skin effect, substrate loss, and proximity effect\",\"authors\":\"F. Rotella, V. Blaschke, D. Howard\",\"doi\":\"10.1109/IEDM.2002.1175881\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A new broad-band scalable spiral inductor model incorporating skin effect, substrate loss, and proximity effect is presented. The construction of the lumped element model using analytic expressions is described and the model is validated with data from multiple technologies. Extensions to differential inductors with measured validation is also provided.\",\"PeriodicalId\":74909,\"journal\":{\"name\":\"Technical digest. International Electron Devices Meeting\",\"volume\":\"122 1\",\"pages\":\"471-474\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-12-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"30\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Technical digest. International Electron Devices Meeting\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEDM.2002.1175881\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Technical digest. International Electron Devices Meeting","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.2002.1175881","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A broad-band scalable lumped-element inductor model using analytic expressions to incorporate skin effect, substrate loss, and proximity effect
A new broad-band scalable spiral inductor model incorporating skin effect, substrate loss, and proximity effect is presented. The construction of the lumped element model using analytic expressions is described and the model is validated with data from multiple technologies. Extensions to differential inductors with measured validation is also provided.