时效对SAC305焊料Anand粘塑性本构模型的影响

Munshi M. Basit, M. Motalab, J. Suhling, P. Lall
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引用次数: 63

摘要

由于对环境的关注,无铅焊料被广泛应用于电子封装行业。然而,实验测试和微观结构表征表明,无铅焊料的性能随着环境暴露(如等温老化和热循环)而发生显著变化。在恶劣环境中,这些变化尤其大,在预测可靠性时,老化对焊点行为的影响必须考虑在内,并包括在本构模型中。在这项工作中,我们对无铅焊料的Anand粘塑性应力-应变关系进行了调整,以包括随焊料热历史演变的材料参数。特别是,通过在100℃下进行不同时效时间(0-12个月)的SAC305样品进行单轴拉伸试验,研究了时效效应。对于每组时效条件,对老化的焊料样品进行了几组恒定应变率和温度试验。试验条件为应变速率0.001、0.0001和0.00001 (1/sec),温度分别为25、50、75、100和125℃。利用实测的单轴试验数据,计算各老化条件下的Anand参数,确定老化对9个Anand模型参数的影响。力学试验使用水淬(WQ)和回流(RF) SAC305样品(两种独特的试样显微结构)进行。在水淬火样品的情况下,在将熔融焊料放入玻璃管和将玻璃管浸入水浴之间的短暂时间内,会发生快速的微观结构转变。另一方面,回流样品首先通过水淬火冷却,然后通过回流炉重新熔化管中的焊料,并使其符合PCB组装中使用的所需温度曲线。从实验结果来看,未进行预时效处理的水淬试样与回流试样提取的Anand模型参数差异较大。正如预期的那样,水淬后的样品比回流后的样品具有更高的力学性能(刚度和强度)。对于水淬和再流试样,随着时效,力学性能明显退化。对Anand模型参数随老化时间的变化进行了表征,并建立了经验关系来模拟观测到的变化。经过长时间时效处理,经水淬再流处理的SAC305材料具有相似的力学性能,其Anand参数趋于一致。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
The effects of aging on the Anand viscoplastic constitutive model for SAC305 solder
Lead free solder materials are widely used in electronic packaging industry due to environmental concerns. However, experimental testing and microstructural characterization have revealed that Pb-free solders exhibit evolving properties that change significantly with environmental exposures such as isothermal aging and thermal cycling. These changes are especially large in harsh environments, where the effects of aging on solder joint behavior must be accounted for and included in constitutive models when predicting reliability. In this work, we have adapted the Anand viscoplastic stress-strain relations for Pb-free solders to include material parameters that evolve with the thermal history of the solder material. In particular, aging effects have been examined by performing uniaxial tensile tests on SAC305 samples that were aged for various durations (0-12 months) at temperature of 100 C. For each set of aging conditions, several sets of constant strain rate and temperature tests were conducted on the aged solder samples. Testing conditions included strain rates of 0.001, 0.0001, and 0.00001 (1/sec), and temperatures of 25, 50, 75, 100, and 125 C. Using the measured uniaxial test data, the Anand parameters were calculated for each set of aging conditions, and the effects of aging on the nine Anand model parameters were determined. Mechanical tests have been performed using both water quenched (WQ) and reflowed (RF) SAC305 samples (two unique specimen microstructures). In the case of the water quenched samples, there is rapid microstructural transitioning during the brief time that occurs between placing molten solder into the glass tubes and immersing the tubes in water bath. On the other hand, the reflowed samples are first cooled by water quenching, and then sent through a reflow oven to re-melt the solder in the tubes and subject them to a desired temperature profile matching that used in PCB assembly. From the experimental results, the differences between the extracted Anand model parameters of water quenched and reflowed samples were high for samples with no prior aging. As expected, the water quenched samples had much higher mechanical properties (stiffness and strength) than reflowed samples prior to aging. For both the water quenched and reflowed specimens, significant degradation of the mechanical properties was observed with aging. The variations of the Anand model parameters with aging time have been characterized, and empirical relationships were established to model the observed changes. After long aging times, the water quenched and reflowed SAC305 materials were found to exhibit similar mechanical properties, and thus their Anand parameters converged and became nearly identical.
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