改进了无铅焊点可靠性的预测,包括老化效应

M. Motalab, Z. Cai, J. Suhling, Jiawei Zhang, J. Evans, M. Bozack, P. Lall
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引用次数: 90

摘要

已经证明,等温时效导致无铅焊料的几个关键材料性能大幅降低(高达50%),包括刚度(模量)、屈服应力、极限强度和失效应变。此外,在老化焊料的蠕变响应中观察到更为戏剧性的演变,在稳态(次级)蠕变应变率(蠕变顺应性)中观察到高达10,000倍的增加。焊接材料的刚度、强度和蠕变顺应性的这种退化预计将普遍损害电子组件中焊点的可靠性。在热循环加速寿命测试中,传统的基于有限元的焊点可靠性预测是基于焊料本构方程(如Anand粘塑性模型)和失效模型(如每循环能量耗散模型),这些模型不随材料老化而变化。因此,在无铅SAC合金的计算中会有很大的误差,这说明了剧烈的老化现象。在我们目前的研究中,我们正在开发新的可靠性预测程序,该程序利用本构关系和包含老化效应的失效准则,然后通过与热循环加速寿命测试实验数据的关联来验证新方法。在本文中,我们报告了这一发展的第一步,即建立了一套修订的Anand粘塑性应力-应变关系,其中包括随焊料热历史演变的材料参数。通过在100℃下进行不同时效时间(0-6个月)的SAC305样品进行应力应变试验,研究了时效对9个Anand模型参数的影响。对于每个时效时间,在三种应变速率(0.001、0.0001和0.00001 1/秒)和五种温度(25、50、75、100和125℃)下测量应力应变数据。利用测量的应力应变数据,确定了不同时效条件下的Anand模型材料参数。建立了Anand模型参数随老化时间变化的数学表达式。我们的研究结果表明,9个常数中有2个在时效过程中基本保持不变,而其他6个在100℃下时效长达6个月时变化较大(30-70%)。初步的有限元模拟也表明,使用改进的Anand模型导致计算的每个循环的塑性功消耗强烈依赖于热循环之前的时效条件。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Improved predictions of lead free solder joint reliability that include aging effects
It has been demonstrated that isothermal aging leads to large reductions (up to 50%) in several key material properties for lead free solders including stiffness (modulus), yield stress, ultimate strength, and strain to failure. In addition, even more dramatic evolution has been observed in the creep response of aged solders, where up to 10,000X increases have been observed in the steady state (secondary) creep strain rate (creep compliance). Such degradations in the stiffness, strength, and creep compliance of the solder material are expected to be universally detrimental to reliability of solder joints in electronic assemblies. Traditional finite element based predictions for solder joint reliability during thermal cycling accelerated life testing are based on solder constitutive equations (e.g. Anand viscoplastic model) and failure models (e.g. energy dissipation per cycle models) that do not evolve with material aging. Thus, there will be significant errors in the calculations with lead free SAC alloys that illustrate dramatic aging phenomena. In our current research, we are developing new reliability prediction procedures that utilize constitutive relations and failure criteria that incorporate aging effects, and then validating the new approaches through correlation with thermal cycling accelerated life testing experimental data. In this paper, we report on the first step of that development, namely the establishment of a revised set of Anand viscoplastic stress-strain relations for solder that include material parameters that evolve with the thermal history of the solder material. The effects of aging on the nine Anand model parameters have been examined by performing stress strain tests on SAC305 samples that were aged for various durations (0-6 months) at a temperature of 100 C. For each aging time, stress-strain data were measured at three strain rates (0.001, 0.0001, and 0.00001 1/sec) and five temperatures (25, 50, 75, 100, and 125 C). Using the measured stress-strain data, the Anand model material parameters have been determined for various aging conditions. Mathematical expressions were then developed to model the evolution of the Anand model parameter with aging time. Our results show that 2 of the 9 constants remain essentially constant during aging, while the other 6 show large changes (30-70%) with up to 6 months of aging at 100 C. Preliminary finite element simulations have also shown that the use of the modified Anand model leads to a strong dependence of the calculated plastic work dissipated per cycle on the aging conditions prior to thermal cycling.
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