智能包装-微温度和湿度传感器嵌入在一个倒装芯片封装

A. Quelennec, Y. Ayadi, Quentin Vandier, É. Duchesne, H. Frémont, D. Drouin
{"title":"智能包装-微温度和湿度传感器嵌入在一个倒装芯片封装","authors":"A. Quelennec, Y. Ayadi, Quentin Vandier, É. Duchesne, H. Frémont, D. Drouin","doi":"10.1109/ECTC.2018.00247","DOIUrl":null,"url":null,"abstract":"The interest in very-large-scale integration technology combined with market pressure to reduce materials and process costs introduce new packaging yield and reliability challenges. The use of organic substrates in flip-chip packages, rather than ceramics, led to thermal and moisture related issues. The organic laminate coefficient of thermal expansion substantially differs from the chip one, potentially leading to interfacial delamination and interconnect rupture. Moreover, organic substrates are permeable to water, potentially leading to electrochemical migration, corrosion of alloys, delamination and short-circuits. Thus temperature and moisture variation can have baneful consequences on flip-chip packages. Here, the internal module temperature and moisture quantities of a flip-chip package are measured using microscopic embedded carbon nanotube-based sensors. Those sensors are fabricated near interconnects and are positioned to provide spatial and real-time mapping of moisture and temperature in the package, for a better interconnect reliability study or package aging monitoring.","PeriodicalId":6555,"journal":{"name":"2018 IEEE 68th Electronic Components and Technology Conference (ECTC)","volume":"14 1","pages":"1639-1644"},"PeriodicalIF":0.0000,"publicationDate":"2018-05-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Smart Packaging - Microscopic Temperature and Moisture Sensors Embedded in a Flip-Chip Package\",\"authors\":\"A. Quelennec, Y. Ayadi, Quentin Vandier, É. Duchesne, H. Frémont, D. Drouin\",\"doi\":\"10.1109/ECTC.2018.00247\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The interest in very-large-scale integration technology combined with market pressure to reduce materials and process costs introduce new packaging yield and reliability challenges. The use of organic substrates in flip-chip packages, rather than ceramics, led to thermal and moisture related issues. The organic laminate coefficient of thermal expansion substantially differs from the chip one, potentially leading to interfacial delamination and interconnect rupture. Moreover, organic substrates are permeable to water, potentially leading to electrochemical migration, corrosion of alloys, delamination and short-circuits. Thus temperature and moisture variation can have baneful consequences on flip-chip packages. Here, the internal module temperature and moisture quantities of a flip-chip package are measured using microscopic embedded carbon nanotube-based sensors. Those sensors are fabricated near interconnects and are positioned to provide spatial and real-time mapping of moisture and temperature in the package, for a better interconnect reliability study or package aging monitoring.\",\"PeriodicalId\":6555,\"journal\":{\"name\":\"2018 IEEE 68th Electronic Components and Technology Conference (ECTC)\",\"volume\":\"14 1\",\"pages\":\"1639-1644\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-05-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 IEEE 68th Electronic Components and Technology Conference (ECTC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ECTC.2018.00247\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE 68th Electronic Components and Technology Conference (ECTC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.2018.00247","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

摘要

对大规模集成技术的兴趣,加上降低材料和工艺成本的市场压力,带来了新的封装良率和可靠性挑战。在倒装芯片封装中使用有机基板,而不是陶瓷,导致了热和湿度相关的问题。有机层压板的热膨胀系数与芯片的热膨胀系数有很大的不同,这可能导致界面分层和互连断裂。此外,有机衬底对水具有渗透性,可能导致电化学迁移、合金腐蚀、分层和短路。因此,温度和湿度的变化可能对倒装芯片封装产生有害的后果。在这里,内部模块的温度和水分量的倒装芯片封装测量使用微观嵌入碳纳米管为基础的传感器。这些传感器在互连附近制造,定位为提供封装中湿度和温度的空间和实时地图,以便更好地研究互连可靠性或封装老化监测。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Smart Packaging - Microscopic Temperature and Moisture Sensors Embedded in a Flip-Chip Package
The interest in very-large-scale integration technology combined with market pressure to reduce materials and process costs introduce new packaging yield and reliability challenges. The use of organic substrates in flip-chip packages, rather than ceramics, led to thermal and moisture related issues. The organic laminate coefficient of thermal expansion substantially differs from the chip one, potentially leading to interfacial delamination and interconnect rupture. Moreover, organic substrates are permeable to water, potentially leading to electrochemical migration, corrosion of alloys, delamination and short-circuits. Thus temperature and moisture variation can have baneful consequences on flip-chip packages. Here, the internal module temperature and moisture quantities of a flip-chip package are measured using microscopic embedded carbon nanotube-based sensors. Those sensors are fabricated near interconnects and are positioned to provide spatial and real-time mapping of moisture and temperature in the package, for a better interconnect reliability study or package aging monitoring.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信