从核反应到系统故障:我们能准确地处理所有级别的软错误吗?

2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS) Pub Date : 2006-07-10 DOI:10.1109/IOLTS.2006.40

L. Anghel, M. Nicolaidis, N. Buard

{"title":"从核反应到系统故障:我们能准确地处理所有级别的软错误吗?","authors":"L. Anghel, M. Nicolaidis, N. Buard","doi":"10.1109/IOLTS.2006.40","DOIUrl":null,"url":null,"abstract":"This panel will bring together a set of experts working in a collaborative project to address at both experimental measurement and simulations all levels of the process leading to system failures induced by soft errors. Several aspects will be discussed, e.g. interaction between energetic particles and the matter, detailed analysis of transient pulse generation and propagation, dependence of the circuit topology and system architecture.","PeriodicalId":6580,"journal":{"name":"2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)","volume":"2 1","pages":"85"},"PeriodicalIF":0.0000,"publicationDate":"2006-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"From Nuclear Reaction to System Failures: Can We Address All Levels of Soft Errors Accurately?\",\"authors\":\"L. Anghel, M. Nicolaidis, N. Buard\",\"doi\":\"10.1109/IOLTS.2006.40\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This panel will bring together a set of experts working in a collaborative project to address at both experimental measurement and simulations all levels of the process leading to system failures induced by soft errors. Several aspects will be discussed, e.g. interaction between energetic particles and the matter, detailed analysis of transient pulse generation and propagation, dependence of the circuit topology and system architecture.\",\"PeriodicalId\":6580,\"journal\":{\"name\":\"2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)\",\"volume\":\"2 1\",\"pages\":\"85\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-07-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IOLTS.2006.40\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IOLTS.2006.40","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

该小组将汇集一组在合作项目中工作的专家，以解决实验测量和模拟过程的所有级别，导致由软错误引起的系统故障。讨论了高能粒子与物质之间的相互作用、瞬态脉冲产生和传播的详细分析、电路拓扑和系统结构的依赖性等几个方面。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

From Nuclear Reaction to System Failures: Can We Address All Levels of Soft Errors Accurately?

This panel will bring together a set of experts working in a collaborative project to address at both experimental measurement and simulations all levels of the process leading to system failures induced by soft errors. Several aspects will be discussed, e.g. interaction between energetic particles and the matter, detailed analysis of transient pulse generation and propagation, dependence of the circuit topology and system architecture.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)

自引率

0.00%

发文量