银线键合工艺及耗材开发

Tao Xu, Joseph Madril, Omid Niayesh, P. Klaerner
{"title":"银线键合工艺及耗材开发","authors":"Tao Xu, Joseph Madril, Omid Niayesh, P. Klaerner","doi":"10.1109/EPTC50525.2020.9315061","DOIUrl":null,"url":null,"abstract":"With increased demands, power modules are often required to run at higher temperatures with improved reliability. Solder joint fatigue is a major failure mode for current power modules. Silver sintering die-attach technology significantly improves power module reliability. Due to the reliability problem at the interface between aluminum (Al) wire and a silver (Ag) layer, bonding Ag wire to the Ag layer is highly desired. Ag wire is harder and stiffer than Al wire, resulting in much higher wear and significantly reduced lifetime of consumables. This paper introduced the K&S CuEx™ bond tool and studied coupling and interaction between the bond tool and Ag wire. By optimizing the bonding process, the CuEx™ bond tools achieved 400,000 touchdowns, which is 80× more than the standard bond tool lifetime of 5,000 touchdowns. The difference between the front-cut and rear-cut process is discussed. By studying and optimizing the cutting process, the standard rear-cut cutter blade lifetime is increased 4×, from 50,000 cuts to 200,000 cuts. It is observed that Ag wire did not wear a wire guide much faster than Al wire. The standard wire guide exhibited minimum wear after 200,000 bonds.","PeriodicalId":6790,"journal":{"name":"2020 IEEE 22nd Electronics Packaging Technology Conference (EPTC)","volume":"1 1","pages":"176-181"},"PeriodicalIF":0.0000,"publicationDate":"2020-12-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Process and Consumable Development for Silver Wire Bonding\",\"authors\":\"Tao Xu, Joseph Madril, Omid Niayesh, P. Klaerner\",\"doi\":\"10.1109/EPTC50525.2020.9315061\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"With increased demands, power modules are often required to run at higher temperatures with improved reliability. Solder joint fatigue is a major failure mode for current power modules. Silver sintering die-attach technology significantly improves power module reliability. Due to the reliability problem at the interface between aluminum (Al) wire and a silver (Ag) layer, bonding Ag wire to the Ag layer is highly desired. Ag wire is harder and stiffer than Al wire, resulting in much higher wear and significantly reduced lifetime of consumables. This paper introduced the K&S CuEx™ bond tool and studied coupling and interaction between the bond tool and Ag wire. By optimizing the bonding process, the CuEx™ bond tools achieved 400,000 touchdowns, which is 80× more than the standard bond tool lifetime of 5,000 touchdowns. The difference between the front-cut and rear-cut process is discussed. By studying and optimizing the cutting process, the standard rear-cut cutter blade lifetime is increased 4×, from 50,000 cuts to 200,000 cuts. It is observed that Ag wire did not wear a wire guide much faster than Al wire. The standard wire guide exhibited minimum wear after 200,000 bonds.\",\"PeriodicalId\":6790,\"journal\":{\"name\":\"2020 IEEE 22nd Electronics Packaging Technology Conference (EPTC)\",\"volume\":\"1 1\",\"pages\":\"176-181\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-12-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 IEEE 22nd Electronics Packaging Technology Conference (EPTC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPTC50525.2020.9315061\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE 22nd Electronics Packaging Technology Conference (EPTC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPTC50525.2020.9315061","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

随着需求的增加,功率模块通常需要在更高的温度下运行,并提高可靠性。焊点疲劳是当前电源模块的主要失效方式。银烧结贴模技术显著提高了电源模块的可靠性。由于铝(Al)线与银(Ag)层之间的界面存在可靠性问题,因此迫切需要将银线与银层结合。Ag线比Al线更硬、更硬,导致更高的磨损和显著降低消耗品的寿命。本文介绍了K&S公司的CuEx™键合工具,研究了键合工具与银丝之间的耦合和相互作用。通过优化粘接工艺,CuEx™粘接工具实现了40万次触地,比标准粘接工具5000次的寿命长80倍。讨论了前切和后切工艺的区别。通过对切削工艺的研究和优化,标准后切刀刀片寿命提高4倍,从5万次切削到20万次切削。结果表明,银丝对导丝的磨损速度比铝丝慢。标准导丝器在20万次粘结后磨损最小。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Process and Consumable Development for Silver Wire Bonding
With increased demands, power modules are often required to run at higher temperatures with improved reliability. Solder joint fatigue is a major failure mode for current power modules. Silver sintering die-attach technology significantly improves power module reliability. Due to the reliability problem at the interface between aluminum (Al) wire and a silver (Ag) layer, bonding Ag wire to the Ag layer is highly desired. Ag wire is harder and stiffer than Al wire, resulting in much higher wear and significantly reduced lifetime of consumables. This paper introduced the K&S CuEx™ bond tool and studied coupling and interaction between the bond tool and Ag wire. By optimizing the bonding process, the CuEx™ bond tools achieved 400,000 touchdowns, which is 80× more than the standard bond tool lifetime of 5,000 touchdowns. The difference between the front-cut and rear-cut process is discussed. By studying and optimizing the cutting process, the standard rear-cut cutter blade lifetime is increased 4×, from 50,000 cuts to 200,000 cuts. It is observed that Ag wire did not wear a wire guide much faster than Al wire. The standard wire guide exhibited minimum wear after 200,000 bonds.
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