Y. C. Wu, W. Kim, K. Garello, F. Yasin, G. Jayakumar, S. Couet, R. Carpenter, S. Kundu, S. Rao, D. Crotti, J. van Houdt, G. Groeseneken, G. Kar
{"title":"确定性和无场电压控制MRAM,适用于高性能和低功耗应用","authors":"Y. C. Wu, W. Kim, K. Garello, F. Yasin, G. Jayakumar, S. Couet, R. Carpenter, S. Kundu, S. Rao, D. Crotti, J. van Houdt, G. Groeseneken, G. Kar","doi":"10.1109/VLSITechnology18217.2020.9265057","DOIUrl":null,"url":null,"abstract":"We propose a deterministic VCMA writing concept that allows exclusion of the pre-read which is required in conventional VCMA write scheme. We apply it on 400°C compatible pMTJ devices with high TMR 246% and retention $\\Delta=54$ and demonstrate a genuine ns-scale write speed. Furthermore, we realize reliable 1.1 GHz external field-free VCMA switching with 20fJ write energy by integrating a magnetic hard mask as the in-plane magnetic field generator. An endurance of more than $10^{10}$ cycles is achieved. Our results address the fundamental write operation challenges of the voltage-controlled MRAM technologies.","PeriodicalId":6850,"journal":{"name":"2020 IEEE Symposium on VLSI Technology","volume":"32 1","pages":"1-2"},"PeriodicalIF":0.0000,"publicationDate":"2020-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":"{\"title\":\"Deterministic and field-free voltage-controlled MRAM for high performance and low power applications\",\"authors\":\"Y. C. Wu, W. Kim, K. Garello, F. Yasin, G. Jayakumar, S. Couet, R. Carpenter, S. Kundu, S. Rao, D. Crotti, J. van Houdt, G. Groeseneken, G. Kar\",\"doi\":\"10.1109/VLSITechnology18217.2020.9265057\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We propose a deterministic VCMA writing concept that allows exclusion of the pre-read which is required in conventional VCMA write scheme. We apply it on 400°C compatible pMTJ devices with high TMR 246% and retention $\\\\Delta=54$ and demonstrate a genuine ns-scale write speed. Furthermore, we realize reliable 1.1 GHz external field-free VCMA switching with 20fJ write energy by integrating a magnetic hard mask as the in-plane magnetic field generator. An endurance of more than $10^{10}$ cycles is achieved. Our results address the fundamental write operation challenges of the voltage-controlled MRAM technologies.\",\"PeriodicalId\":6850,\"journal\":{\"name\":\"2020 IEEE Symposium on VLSI Technology\",\"volume\":\"32 1\",\"pages\":\"1-2\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"10\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 IEEE Symposium on VLSI Technology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VLSITechnology18217.2020.9265057\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE Symposium on VLSI Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSITechnology18217.2020.9265057","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Deterministic and field-free voltage-controlled MRAM for high performance and low power applications
We propose a deterministic VCMA writing concept that allows exclusion of the pre-read which is required in conventional VCMA write scheme. We apply it on 400°C compatible pMTJ devices with high TMR 246% and retention $\Delta=54$ and demonstrate a genuine ns-scale write speed. Furthermore, we realize reliable 1.1 GHz external field-free VCMA switching with 20fJ write energy by integrating a magnetic hard mask as the in-plane magnetic field generator. An endurance of more than $10^{10}$ cycles is achieved. Our results address the fundamental write operation challenges of the voltage-controlled MRAM technologies.