{"title":"基于有限元法的连接器接触电阻研究","authors":"Chenzefang Feng, Xinxin Lin, Yixin Xu, F. Zhu","doi":"10.1109/EPTC50525.2020.9314867","DOIUrl":null,"url":null,"abstract":"Due to the widespread use of electrical connectors while the lack of relevant in-depth theoretical models for contact states of them, this paper has investigated the electrical contact situations in contactor by establishing the theoretical model of a typical electrical connector-Subminiature version A (SMA), and used the finite element method (FEM) to analyze the actual contact state, including its contact potential distribution and the structural influence on resistance.","PeriodicalId":6790,"journal":{"name":"2020 IEEE 22nd Electronics Packaging Technology Conference (EPTC)","volume":"51 1","pages":"403-405"},"PeriodicalIF":0.0000,"publicationDate":"2020-12-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Investigation on Contact Resistance of Connector Based on FEM\",\"authors\":\"Chenzefang Feng, Xinxin Lin, Yixin Xu, F. Zhu\",\"doi\":\"10.1109/EPTC50525.2020.9314867\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Due to the widespread use of electrical connectors while the lack of relevant in-depth theoretical models for contact states of them, this paper has investigated the electrical contact situations in contactor by establishing the theoretical model of a typical electrical connector-Subminiature version A (SMA), and used the finite element method (FEM) to analyze the actual contact state, including its contact potential distribution and the structural influence on resistance.\",\"PeriodicalId\":6790,\"journal\":{\"name\":\"2020 IEEE 22nd Electronics Packaging Technology Conference (EPTC)\",\"volume\":\"51 1\",\"pages\":\"403-405\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-12-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 IEEE 22nd Electronics Packaging Technology Conference (EPTC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPTC50525.2020.9314867\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE 22nd Electronics Packaging Technology Conference (EPTC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPTC50525.2020.9314867","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Investigation on Contact Resistance of Connector Based on FEM
Due to the widespread use of electrical connectors while the lack of relevant in-depth theoretical models for contact states of them, this paper has investigated the electrical contact situations in contactor by establishing the theoretical model of a typical electrical connector-Subminiature version A (SMA), and used the finite element method (FEM) to analyze the actual contact state, including its contact potential distribution and the structural influence on resistance.